Abstract
We present an albedo-centric reverse-ray tracing software to model the influence of albedo surfaces with complex spectro-angular reflectance (i.e. diffuse, glossy, specular, and metamaterials) on the short-circuit current density of a bifacial module. We find that for a silicon heterojunction module, a diffuse albedo leads to higher output and is more robust to self-shading and changes in orientation than a specular reflector. Our approach enables detailed and accurate albedo-dependent output calculation for various known and even exotic reflectors. Such a methodology can be used to design optimal reflectors and determine optimal configurations.
Original language | English |
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Title of host publication | 2021 IEEE 48th Photovoltaic Specialists Conference, PVSC 2021 |
Place of Publication | Piscataway, NJ |
Publisher | IEEE |
Pages | 1159-1162 |
Number of pages | 4 |
ISBN (Electronic) | 978-1-6654-1922-2 |
ISBN (Print) | 978-1-6654-3018-0 |
DOIs | |
Publication status | Published - 26 Aug 2021 |
Event | 48th IEEE Photovoltaic Specialists Conference, PVSC 2021 - Fort Lauderdale, United States Duration: 20 Jun 2021 → 25 Jun 2021 Conference number: 48 |
Publication series
Name | Conference Record of the IEEE Photovoltaic Specialists Conference |
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Publisher | IEEE |
Volume | 2021 |
ISSN (Print) | 0160-8371 |
Conference
Conference | 48th IEEE Photovoltaic Specialists Conference, PVSC 2021 |
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Abbreviated title | PVSC 2021 |
Country/Territory | United States |
City | Fort Lauderdale |
Period | 20/06/21 → 25/06/21 |
Keywords
- Bifacial modules
- Diffuse albedo
- Glossy albedo
- Reverse ray-tracing
- Short-circuit current density
- Spectro-angular albedo
- Specular albedo