Oxidation kinetics of chromium and morphological phenomena

E.A. Polman, T. Fransen, P.J. Gellings

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Abstract

The oxidation kinetics of chromium at 900°C are independent of the oxygen partial pressure. Although this observation gives evidence for a defect mechanism where chromium interstitials account for the chromium transport in the oxide scale, the experimental phenomena do not support one single model. The occurrence of oxide whiskers and oxide ridges are explained by the energy of activation for the breakup of the oxidant molecule. Large oxide pegs are formed at metal multiple-grain junctions after scale breakdown.
Original languageEnglish
Pages (from-to)433–447
JournalOxidation of metals
Volume32
Issue number5-6
DOIs
Publication statusPublished - 1989

Keywords

  • Ion implantation
  • Oxidation
  • sulphidation
  • IR-85591
  • CER
  • Incoloy 800H

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