Oxide breakdown

J.F. Verweij, J.H. Klootwijk

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the Sixth ESPRIT Workshop on Characterisation and Growth of Thin Dielectrics in Microelectronics
    Place of PublicationKinsale, Co. Cork
    Pages2-35
    Publication statusPublished - 22 Nov 1994

    Keywords

    • METIS-113991

    Cite this

    Verweij, J. F., & Klootwijk, J. H. (1994). Oxide breakdown. In Proceedings of the Sixth ESPRIT Workshop on Characterisation and Growth of Thin Dielectrics in Microelectronics (pp. 2-35). Kinsale, Co. Cork.
    Verweij, J.F. ; Klootwijk, J.H. / Oxide breakdown. Proceedings of the Sixth ESPRIT Workshop on Characterisation and Growth of Thin Dielectrics in Microelectronics. Kinsale, Co. Cork, 1994. pp. 2-35
    @inproceedings{8f536c8c36e046ce8df8fd59a6fb7e6f,
    title = "Oxide breakdown",
    keywords = "METIS-113991",
    author = "J.F. Verweij and J.H. Klootwijk",
    year = "1994",
    month = "11",
    day = "22",
    language = "Undefined",
    pages = "2--35",
    booktitle = "Proceedings of the Sixth ESPRIT Workshop on Characterisation and Growth of Thin Dielectrics in Microelectronics",

    }

    Verweij, JF & Klootwijk, JH 1994, Oxide breakdown. in Proceedings of the Sixth ESPRIT Workshop on Characterisation and Growth of Thin Dielectrics in Microelectronics. Kinsale, Co. Cork, pp. 2-35.

    Oxide breakdown. / Verweij, J.F.; Klootwijk, J.H.

    Proceedings of the Sixth ESPRIT Workshop on Characterisation and Growth of Thin Dielectrics in Microelectronics. Kinsale, Co. Cork, 1994. p. 2-35.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    TY - GEN

    T1 - Oxide breakdown

    AU - Verweij, J.F.

    AU - Klootwijk, J.H.

    PY - 1994/11/22

    Y1 - 1994/11/22

    KW - METIS-113991

    M3 - Conference contribution

    SP - 2

    EP - 35

    BT - Proceedings of the Sixth ESPRIT Workshop on Characterisation and Growth of Thin Dielectrics in Microelectronics

    CY - Kinsale, Co. Cork

    ER -

    Verweij JF, Klootwijk JH. Oxide breakdown. In Proceedings of the Sixth ESPRIT Workshop on Characterisation and Growth of Thin Dielectrics in Microelectronics. Kinsale, Co. Cork. 1994. p. 2-35