Oxygen diffusion characterization in ultrathin films by low energy ion scattering

Research output: Contribution to conferencePosterAcademic

Original languageEnglish
Publication statusPublished - 23 Jan 2018
EventPhysics@Veldhoven 2018 - NH Conference Center Koningshof, Velhoven, Netherlands
Duration: 23 Jan 201824 Jan 2019
https://www.nwo-i.nl/agenda/agenda/physicsveldhoven-2018/

Conference

ConferencePhysics@Veldhoven 2018
CountryNetherlands
CityVelhoven
Period23/01/1824/01/19
Internet address

Cite this

@conference{8167cf82af314d2081298da9f5894feb,
title = "Oxygen diffusion characterization in ultrathin films by low energy ion scattering",
author = "{Stilhano Vilas Boas}, {Cristiane Regina} and J.M. Sturm and Frederik Bijkerk",
year = "2018",
month = "1",
day = "23",
language = "English",
note = "Physics@Veldhoven 2018 ; Conference date: 23-01-2018 Through 24-01-2019",
url = "https://www.nwo-i.nl/agenda/agenda/physicsveldhoven-2018/",

}

Oxygen diffusion characterization in ultrathin films by low energy ion scattering. / Stilhano Vilas Boas, Cristiane Regina; Sturm, J.M. (Contributor); Bijkerk, Frederik (Contributor).

2018. Poster session presented at Physics@Veldhoven 2018, Velhoven, Netherlands.

Research output: Contribution to conferencePosterAcademic

TY - CONF

T1 - Oxygen diffusion characterization in ultrathin films by low energy ion scattering

AU - Stilhano Vilas Boas, Cristiane Regina

A2 - Sturm, J.M.

A2 - Bijkerk, Frederik

PY - 2018/1/23

Y1 - 2018/1/23

M3 - Poster

ER -

Stilhano Vilas Boas CR, Sturm JM, Bijkerk F. Oxygen diffusion characterization in ultrathin films by low energy ion scattering. 2018. Poster session presented at Physics@Veldhoven 2018, Velhoven, Netherlands.