Parameterization Models for Traceable Characterization of Planar CPW SOL Calibration Standards

F. Mubarak; V. Mascolo; G. Rietveld; M. Spirito; K. Daffe; K. Haddadi

doi:10.1109/CPEM.2018.8500810

Parameterization Models for Traceable Characterization of Planar CPW SOL Calibration Standards

F. Mubarak
, V. Mascolo
, G. Rietveld
, M. Spirito
, K. Daffe
, K. Haddadi

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

4 Citations (Scopus)

Abstract

Methods for traceable characterization and uncertainty evaluation of planar I-port CPW short-open-Ioad (SOL) devices are developed. The agreement of modelling and verification measurement results greatly supports the application of the proposed parameterization models and used FEM-based EM modelling of CPW structures for traceable characterization of planar CPW-based SOL devices in the frequency range between a few kHz up to 50 GHz.

Original language	English
Title of host publication	CPEM 2018 - Conference on Precision Electromagnetic Measurements
Place of Publication	Piscataway, NJ
Publisher	IEEE
ISBN (Electronic)	978-1-5386-0974-3, 978-1-5386-0973-6 (USB)
ISBN (Print)	978-1-5386-2130-1
DOIs	https://doi.org/10.1109/CPEM.2018.8500810
Publication status	Published - 19 Oct 2018
Externally published	Yes
Event	Conference on Precision Electromagnetic Measurements, CPEM 2018 - Maison de la Chimie, Paris, France Duration: 8 Jul 2018 → 13 Jul 2018 http://www.cpem2018.com/

Publication series

Name	CPEM - Conference on Precision Electromagnetic Measurements
Publisher	IEEE
Volume	2018
ISSN (Print)	0589-1485
ISSN (Electronic)	2160-0171

Conference

Conference	Conference on Precision Electromagnetic Measurements, CPEM 2018
Abbreviated title	CPEM 2018
Country/Territory	France
City	Paris
Period	8/07/18 → 13/07/18
Internet address	http://www.cpem2018.com/

Keywords

Co-planar waveguide
EM simulation
Measurement uncertainty
Nanostructures
On-wafer calibration
Precision measurements
Traceability
VNA
n/a OA procedure

Access to Document

10.1109/CPEM.2018.8500810

Cite this

Mubarak, F., Mascolo, V., Rietveld, G., Spirito, M., Daffe, K., & Haddadi, K. (2018). Parameterization Models for Traceable Characterization of Planar CPW SOL Calibration Standards. In CPEM 2018 - Conference on Precision Electromagnetic Measurements Article 8500810 (CPEM - Conference on Precision Electromagnetic Measurements; Vol. 2018). IEEE. https://doi.org/10.1109/CPEM.2018.8500810

@inproceedings{dd3985640a9148c8abc9a020275b5476,

title = "Parameterization Models for Traceable Characterization of Planar CPW SOL Calibration Standards",

abstract = "Methods for traceable characterization and uncertainty evaluation of planar I-port CPW short-open-Ioad (SOL) devices are developed. The agreement of modelling and verification measurement results greatly supports the application of the proposed parameterization models and used FEM-based EM modelling of CPW structures for traceable characterization of planar CPW-based SOL devices in the frequency range between a few kHz up to 50 GHz.",

keywords = "Co-planar waveguide, EM simulation, Measurement uncertainty, Nanostructures, On-wafer calibration, Precision measurements, Traceability, VNA, n/a OA procedure",

author = "F. Mubarak and V. Mascolo and G. Rietveld and M. Spirito and K. Daffe and K. Haddadi",

note = "Funding Information: This work was funded through the European Metrology Research Programme (EMPIR) Project PlanarCal {\textquoteleft}Metrology for New Electrical Measurement Quantities in High-frequency Circuits{\textquoteright} and the Dutch Ministry of Economic Affairs. The EMPIR is jointly funded by the EMPIR participating countries within EURAMET and the European Union. Publisher Copyright: {\textcopyright} 2018 IEEE.; Conference on Precision Electromagnetic Measurements, CPEM 2018, CPEM 2018 ; Conference date: 08-07-2018 Through 13-07-2018",

year = "2018",

month = oct,

day = "19",

doi = "10.1109/CPEM.2018.8500810",

language = "English",

isbn = "978-1-5386-2130-1",

series = "CPEM - Conference on Precision Electromagnetic Measurements",

publisher = "IEEE",

booktitle = "CPEM 2018 - Conference on Precision Electromagnetic Measurements",

address = "United States",

url = "http://www.cpem2018.com/",

}

Mubarak, F, Mascolo, V, Rietveld, G, Spirito, M, Daffe, K & Haddadi, K 2018, Parameterization Models for Traceable Characterization of Planar CPW SOL Calibration Standards. in CPEM 2018 - Conference on Precision Electromagnetic Measurements., 8500810, CPEM - Conference on Precision Electromagnetic Measurements, vol. 2018, IEEE, Piscataway, NJ, Conference on Precision Electromagnetic Measurements, CPEM 2018, Paris, France, 8/07/18. https://doi.org/10.1109/CPEM.2018.8500810

Parameterization Models for Traceable Characterization of Planar CPW SOL Calibration Standards. / Mubarak, F.; Mascolo, V.; Rietveld, G. et al.
CPEM 2018 - Conference on Precision Electromagnetic Measurements. Piscataway, NJ: IEEE, 2018. 8500810 (CPEM - Conference on Precision Electromagnetic Measurements; Vol. 2018).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Parameterization Models for Traceable Characterization of Planar CPW SOL Calibration Standards

AU - Mubarak, F.

AU - Mascolo, V.

AU - Rietveld, G.

AU - Spirito, M.

AU - Daffe, K.

AU - Haddadi, K.

N1 - Funding Information: This work was funded through the European Metrology Research Programme (EMPIR) Project PlanarCal ‘Metrology for New Electrical Measurement Quantities in High-frequency Circuits’ and the Dutch Ministry of Economic Affairs. The EMPIR is jointly funded by the EMPIR participating countries within EURAMET and the European Union. Publisher Copyright: © 2018 IEEE.

PY - 2018/10/19

Y1 - 2018/10/19

N2 - Methods for traceable characterization and uncertainty evaluation of planar I-port CPW short-open-Ioad (SOL) devices are developed. The agreement of modelling and verification measurement results greatly supports the application of the proposed parameterization models and used FEM-based EM modelling of CPW structures for traceable characterization of planar CPW-based SOL devices in the frequency range between a few kHz up to 50 GHz.

AB - Methods for traceable characterization and uncertainty evaluation of planar I-port CPW short-open-Ioad (SOL) devices are developed. The agreement of modelling and verification measurement results greatly supports the application of the proposed parameterization models and used FEM-based EM modelling of CPW structures for traceable characterization of planar CPW-based SOL devices in the frequency range between a few kHz up to 50 GHz.

KW - Co-planar waveguide

KW - EM simulation

KW - Measurement uncertainty

KW - Nanostructures

KW - On-wafer calibration

KW - Precision measurements

KW - Traceability

KW - VNA

KW - n/a OA procedure

UR - https://www.scopus.com/pages/publications/85057061313

U2 - 10.1109/CPEM.2018.8500810

DO - 10.1109/CPEM.2018.8500810

M3 - Conference contribution

AN - SCOPUS:85057061313

SN - 978-1-5386-2130-1

T3 - CPEM - Conference on Precision Electromagnetic Measurements

BT - CPEM 2018 - Conference on Precision Electromagnetic Measurements

PB - IEEE

CY - Piscataway, NJ

T2 - Conference on Precision Electromagnetic Measurements, CPEM 2018

Y2 - 8 July 2018 through 13 July 2018

ER -

Parameterization Models for Traceable Characterization of Planar CPW SOL Calibration Standards

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Keywords

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