Path Length Resolved Dynamic Light Scattering Measurements with Suppressed Influence of Optical Properties Using Phase Modulated Low Coherence Interferometry

Babu Varghese, Wiendelt Steenbergen

Research output: Chapter in Book/Report/Conference proceedingChapterAcademicpeer-review

Original languageUndefined
Title of host publicationInterferometry - Research and Applications in Science and Technology
EditorsIvan Padron
PublisherInTech
Pages209-224
ISBN (Print)978-953-51-0403-2
Publication statusPublished - 2012

Publication series

Name
PublisherInTech

Keywords

  • METIS-286490
  • IR-84685

Cite this

Varghese, B., & Steenbergen, W. (2012). Path Length Resolved Dynamic Light Scattering Measurements with Suppressed Influence of Optical Properties Using Phase Modulated Low Coherence Interferometry. In I. Padron (Ed.), Interferometry - Research and Applications in Science and Technology (pp. 209-224). InTech.