Path Length Resolved Dynamic Light Scattering Measurements with Suppressed Influence of Optical Properties Using Phase Modulated Low Coherence Interferometry

Babu Varghese, Wiendelt Steenbergen

Research output: Chapter in Book/Report/Conference proceedingChapterAcademicpeer-review

Original languageUndefined
Title of host publicationInterferometry - Research and Applications in Science and Technology
EditorsIvan Padron
PublisherInTech
Pages209-224
ISBN (Print)978-953-51-0403-2
Publication statusPublished - 2012

Publication series

Name
PublisherInTech

Keywords

  • METIS-286490
  • IR-84685

Cite this

Varghese, B., & Steenbergen, W. (2012). Path Length Resolved Dynamic Light Scattering Measurements with Suppressed Influence of Optical Properties Using Phase Modulated Low Coherence Interferometry. In I. Padron (Ed.), Interferometry - Research and Applications in Science and Technology (pp. 209-224). InTech.
Varghese, Babu ; Steenbergen, Wiendelt. / Path Length Resolved Dynamic Light Scattering Measurements with Suppressed Influence of Optical Properties Using Phase Modulated Low Coherence Interferometry. Interferometry - Research and Applications in Science and Technology. editor / Ivan Padron. InTech, 2012. pp. 209-224
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language = "Undefined",
isbn = "978-953-51-0403-2",
publisher = "InTech",
pages = "209--224",
editor = "Ivan Padron",
booktitle = "Interferometry - Research and Applications in Science and Technology",
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Varghese, B & Steenbergen, W 2012, Path Length Resolved Dynamic Light Scattering Measurements with Suppressed Influence of Optical Properties Using Phase Modulated Low Coherence Interferometry. in I Padron (ed.), Interferometry - Research and Applications in Science and Technology. InTech, pp. 209-224.

Path Length Resolved Dynamic Light Scattering Measurements with Suppressed Influence of Optical Properties Using Phase Modulated Low Coherence Interferometry. / Varghese, Babu; Steenbergen, Wiendelt.

Interferometry - Research and Applications in Science and Technology. ed. / Ivan Padron. InTech, 2012. p. 209-224.

Research output: Chapter in Book/Report/Conference proceedingChapterAcademicpeer-review

TY - CHAP

T1 - Path Length Resolved Dynamic Light Scattering Measurements with Suppressed Influence of Optical Properties Using Phase Modulated Low Coherence Interferometry

AU - Varghese, Babu

AU - Steenbergen, Wiendelt

PY - 2012

Y1 - 2012

KW - METIS-286490

KW - IR-84685

M3 - Chapter

SN - 978-953-51-0403-2

SP - 209

EP - 224

BT - Interferometry - Research and Applications in Science and Technology

A2 - Padron, Ivan

PB - InTech

ER -

Varghese B, Steenbergen W. Path Length Resolved Dynamic Light Scattering Measurements with Suppressed Influence of Optical Properties Using Phase Modulated Low Coherence Interferometry. In Padron I, editor, Interferometry - Research and Applications in Science and Technology. InTech. 2012. p. 209-224