Pattern recognition and parameter estimation: A tool for automated measurement

Z. Houkes, Maarten J. Korsten, Ferdinand van der Heijden

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationInternational IMEKO Symposium
    Place of PublicationKarlsruhe D.
    Number of pages10
    Publication statusPublished - 1 Sep 1990


    • METIS-113394

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