Pattern recognition and parameter estimation: A tool for automated measurement

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationInternational IMEKO Symposium
    Place of PublicationKarlsruhe D.
    Pages285-294
    Number of pages10
    Publication statusPublished - 1 Sep 1990

    Keywords

    • METIS-113394

    Cite this

    Houkes, Z., Korsten, M. J., & van der Heijden, F. (1990). Pattern recognition and parameter estimation: A tool for automated measurement. In International IMEKO Symposium (pp. 285-294). Karlsruhe D..
    @inproceedings{73b0c12903e94a4696482ca07f206254,
    title = "Pattern recognition and parameter estimation: A tool for automated measurement",
    keywords = "METIS-113394",
    author = "Z. Houkes and Korsten, {Maarten J.} and {van der Heijden}, Ferdinand",
    year = "1990",
    month = "9",
    day = "1",
    language = "Undefined",
    pages = "285--294",
    booktitle = "International IMEKO Symposium",

    }

    Houkes, Z, Korsten, MJ & van der Heijden, F 1990, Pattern recognition and parameter estimation: A tool for automated measurement. in International IMEKO Symposium. Karlsruhe D., pp. 285-294.

    Pattern recognition and parameter estimation: A tool for automated measurement. / Houkes, Z.; Korsten, Maarten J.; van der Heijden, Ferdinand.

    International IMEKO Symposium. Karlsruhe D., 1990. p. 285-294.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    TY - GEN

    T1 - Pattern recognition and parameter estimation: A tool for automated measurement

    AU - Houkes, Z.

    AU - Korsten, Maarten J.

    AU - van der Heijden, Ferdinand

    PY - 1990/9/1

    Y1 - 1990/9/1

    KW - METIS-113394

    M3 - Conference contribution

    SP - 285

    EP - 294

    BT - International IMEKO Symposium

    CY - Karlsruhe D.

    ER -

    Houkes Z, Korsten MJ, van der Heijden F. Pattern recognition and parameter estimation: A tool for automated measurement. In International IMEKO Symposium. Karlsruhe D. 1990. p. 285-294