Pattern recognition and parameter estimation: A tool for automated measurement

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationInternational IMEKO Symposium
    Place of PublicationKarlsruhe D.
    Pages285-294
    Number of pages10
    Publication statusPublished - 1 Sep 1990

    Keywords

    • METIS-113394

    Cite this

    Houkes, Z., Korsten, M. J., & van der Heijden, F. (1990). Pattern recognition and parameter estimation: A tool for automated measurement. In International IMEKO Symposium (pp. 285-294). Karlsruhe D..