Pattern recognition and parameter estimation: A tool for automated measurement

Zweitze Houkes, Maarten J. Korsten, Ferdinand van der Heijden

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	IMEKO Conference
Subtitle of host publication	26-28 September 1990, Karlsruhe
Publisher	VDI Verlag GMBH
Pages	285-294
Number of pages	10
Publication status	Published - 1990
Event	IMEKO Conference 1990 - Karlsruhe, Germany Duration: 26 Sept 1990 → 28 Sept 1990

Cite this

@inproceedings{73b0c12903e94a4696482ca07f206254,

title = "Pattern recognition and parameter estimation: A tool for automated measurement",

author = "Zweitze Houkes and Korsten, {Maarten J.} and {van der Heijden}, Ferdinand",

year = "1990",

language = "English",

series = "VDI Berichte",

publisher = "VDI Verlag GMBH",

pages = "285--294",

booktitle = "IMEKO Conference",

address = "Germany",

note = "IMEKO Conference 1990 ; Conference date: 26-09-1990 Through 28-09-1990",

}

Pattern recognition and parameter estimation: A tool for automated measurement. / Houkes, Zweitze; Korsten, Maarten J.; van der Heijden, Ferdinand.
IMEKO Conference: 26-28 September 1990, Karlsruhe. VDI Verlag GMBH, 1990. p. 285-294 (VDI Berichte; Vol. 856).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review