Pattern recognition and parameter estimation: A tool for automated measurement

Z. Houkes, Maarten J. Korsten, Ferdinand van der Heijden

    Research output: Contribution to journalArticleAcademic

    Original languageUndefined
    Pages (from-to)285-294
    Number of pages10
    JournalVDI Berichte
    Volume1990
    Issue number856
    Publication statusPublished - 1990

    Keywords

    • METIS-111796

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