| Original language | Undefined |
|---|---|
| Pages (from-to) | 285-294 |
| Number of pages | 10 |
| Journal | VDI Berichte |
| Volume | 1990 |
| Issue number | 856 |
| Publication status | Published - 1990 |
Keywords
- METIS-111796
Cite this
Houkes, Z., Korsten, M. J., & van der Heijden, F. (1990). Pattern recognition and parameter estimation: A tool for automated measurement. VDI Berichte, 1990(856), 285-294.
@article{97affcb57b5743adbe138d4ab2ed8354,
title = "Pattern recognition and parameter estimation: A tool for automated measurement",
keywords = "METIS-111796",
author = "Z. Houkes and Korsten, {Maarten J.} and {van der Heijden}, Ferdinand",
year = "1990",
language = "Undefined",
volume = "1990",
pages = "285--294",
journal = "VDI Berichte",
issn = "0083-5560",
publisher = "VDI Verlag GMBH",
number = "856",
}
Houkes, Z, Korsten, MJ & van der Heijden, F 1990, 'Pattern recognition and parameter estimation: A tool for automated measurement', VDI Berichte, vol. 1990, no. 856, pp. 285-294.
Pattern recognition and parameter estimation: A tool for automated measurement. / Houkes, Z.; Korsten, Maarten J.; van der Heijden, Ferdinand.
In: VDI Berichte, Vol. 1990, No. 856, 1990, p. 285-294.Research output: Contribution to journal › Article › Academic
TY - JOUR
T1 - Pattern recognition and parameter estimation: A tool for automated measurement
AU - Houkes, Z.
AU - Korsten, Maarten J.
AU - van der Heijden, Ferdinand
PY - 1990
Y1 - 1990
KW - METIS-111796
M3 - Article
VL - 1990
SP - 285
EP - 294
JO - VDI Berichte
JF - VDI Berichte
SN - 0083-5560
IS - 856
ER -
Houkes Z, Korsten MJ, van der Heijden F. Pattern recognition and parameter estimation: A tool for automated measurement. VDI Berichte. 1990;1990(856):285-294.