Pattern recognition and parameter estimation: A tool for automated measurement

    Research output: Contribution to journalArticleAcademic

    Original languageUndefined
    Pages (from-to)285-294
    Number of pages10
    JournalVDI Berichte
    Volume1990
    Issue number856
    Publication statusPublished - 1990

    Keywords

    • METIS-111796

    Cite this

    @article{97affcb57b5743adbe138d4ab2ed8354,
    title = "Pattern recognition and parameter estimation: A tool for automated measurement",
    keywords = "METIS-111796",
    author = "Z. Houkes and Korsten, {Maarten J.} and {van der Heijden}, Ferdinand",
    year = "1990",
    language = "Undefined",
    volume = "1990",
    pages = "285--294",
    journal = "VDI Berichte",
    issn = "0083-5560",
    publisher = "VDI Verlag GMBH",
    number = "856",

    }

    Pattern recognition and parameter estimation: A tool for automated measurement. / Houkes, Z.; Korsten, Maarten J.; van der Heijden, Ferdinand.

    In: VDI Berichte, Vol. 1990, No. 856, 1990, p. 285-294.

    Research output: Contribution to journalArticleAcademic

    TY - JOUR

    T1 - Pattern recognition and parameter estimation: A tool for automated measurement

    AU - Houkes, Z.

    AU - Korsten, Maarten J.

    AU - van der Heijden, Ferdinand

    PY - 1990

    Y1 - 1990

    KW - METIS-111796

    M3 - Article

    VL - 1990

    SP - 285

    EP - 294

    JO - VDI Berichte

    JF - VDI Berichte

    SN - 0083-5560

    IS - 856

    ER -