Abstract
An arrayed-waveguide grating (AWG) with its high accuracy and stability is a powerful tool for spectral analysis. We investigate its potential for spectral-domain optical coherence tomography (SD-OCT). A silicon-oxynitride-based AWG spectrometer for the 800 nm wavelength range is designed for on-chip SD-OCT systems. By removing the output waveguides of the AWG, the depth range is significantly enhanced. In addition, the effect of polarization dependency of the AWG on sensitivity roll-off is investigated and for partial polarization, a beat effect is observed in the depth ranging measurements, which leads to signal fading at specific depths.
Original language | Undefined |
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Pages | 241-244 |
Number of pages | 4 |
Publication status | Published - 11 Dec 2011 |
Event | 16th Annual Symposium of the IEEE Photonics Benelux Chapter 2011 - Ghent, Belgium Duration: 1 Dec 2011 → 2 Dec 2011 Conference number: 16 http://www.photonics-benelux.org/symp11/ |
Conference
Conference | 16th Annual Symposium of the IEEE Photonics Benelux Chapter 2011 |
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Country/Territory | Belgium |
City | Ghent |
Period | 1/12/11 → 2/12/11 |
Internet address |
Keywords
- IOMS-SNS: SENSORS
- IR-79366
- EWI-21284