Abstract
An arrayed-waveguide grating (AWG) with its high accuracy and stability is a powerful tool for spectral analysis. We investigate its potential for spectral-domain optical coherence tomography (SD-OCT). A silicon-oxynitride-based AWG spectrometer for the 800 nm wavelength range is designed for on-chip SD-OCT systems. By removing the output waveguides of the AWG, the depth range is significantly enhanced. In addition, the effect of polarization dependency of the AWG on sensitivity roll-off is investigated and for partial polarization, a beat effect is observed in the depth ranging measurements, which leads to signal fading at specific depths.
| Original language | Undefined |
|---|---|
| Pages | 241-244 |
| Number of pages | 4 |
| Publication status | Published - 11 Dec 2011 |
| Event | 16th Annual Symposium of the IEEE Photonics Benelux Chapter 2011 - Ghent, Belgium Duration: 1 Dec 2011 → 2 Dec 2011 Conference number: 16 http://www.photonics-benelux.org/symp11/ |
Conference
| Conference | 16th Annual Symposium of the IEEE Photonics Benelux Chapter 2011 |
|---|---|
| Country/Territory | Belgium |
| City | Ghent |
| Period | 1/12/11 → 2/12/11 |
| Internet address |
Keywords
- IOMS-SNS: SENSORS
- IR-79366
- EWI-21284