Phase characterization of the reflection on an extreme UV multilayer: comparison between attosecond metrology and standing wave measurements

R.A. Loch; A. Dubrouil; R. Sobierajski; D. Descamps; Benoit Fabre; P. Lidon; Robbert Wilhelmus Elisabeth van de Kruijs; F. Boekhout; E.M. Gullikson; J. Gaudin; Eric Louis; Frederik Bijkerk; E. Mevel; S. Petit; E. Constant; Y. Mairesse

doi:10.1364/OL.36.003386

Phase characterization of the reflection on an extreme UV multilayer: comparison between attosecond metrology and standing wave measurements

R.A. Loch, A. Dubrouil, R. Sobierajski, D. Descamps, Benoit Fabre, P. Lidon, Robbert Wilhelmus Elisabeth van de Kruijs, F. Boekhout, E.M. Gullikson, J. Gaudin, Eric Louis, Frederik Bijkerk, E. Mevel, S. Petit, E. Constant, Y. Mairesse

Laser Physics & Nonlinear Optics

Research output: Contribution to journal › Article › Academic › peer-review

16 Citations (Scopus)

Original language	English
Pages (from-to)	3386-3388
Number of pages	3
Journal	Optics letters
Volume	36
Issue number	17
DOIs	https://doi.org/10.1364/OL.36.003386
Publication status	Published - 2011

Keywords

METIS-277885

Access to Document

10.1364/OL.36.003386

Cite this

Loch, R. A., Dubrouil, A., Sobierajski, R., Descamps, D., Fabre, B., Lidon, P., van de Kruijs, R. W. E., Boekhout, F., Gullikson, E. M., Gaudin, J., Louis, E., Bijkerk, F., Mevel, E., Petit, S., Constant, E., & Mairesse, Y. (2011). Phase characterization of the reflection on an extreme UV multilayer: comparison between attosecond metrology and standing wave measurements. Optics letters, 36(17), 3386-3388. https://doi.org/10.1364/OL.36.003386

Loch, R.A. ; Dubrouil, A. ; Sobierajski, R. ; Descamps, D. ; Fabre, Benoit ; Lidon, P. ; van de Kruijs, Robbert Wilhelmus Elisabeth ; Boekhout, F. ; Gullikson, E.M. ; Gaudin, J. ; Louis, Eric ; Bijkerk, Frederik ; Mevel, E. ; Petit, S. ; Constant, E. ; Mairesse, Y. / Phase characterization of the reflection on an extreme UV multilayer: comparison between attosecond metrology and standing wave measurements. In: Optics letters. 2011 ; Vol. 36, No. 17. pp. 3386-3388.

@article{1cf7e8ecd16b4292b574bbbf49e7203d,

title = "Phase characterization of the reflection on an extreme UV multilayer: comparison between attosecond metrology and standing wave measurements",

keywords = "METIS-277885",

author = "R.A. Loch and A. Dubrouil and R. Sobierajski and D. Descamps and Benoit Fabre and P. Lidon and {van de Kruijs}, {Robbert Wilhelmus Elisabeth} and F. Boekhout and E.M. Gullikson and J. Gaudin and Eric Louis and Frederik Bijkerk and E. Mevel and S. Petit and E. Constant and Y. Mairesse",

year = "2011",

doi = "10.1364/OL.36.003386",

language = "English",

volume = "36",

pages = "3386--3388",

journal = "Optics letters",

issn = "0146-9592",

publisher = "The Optical Society",

number = "17",

}

Loch, RA, Dubrouil, A, Sobierajski, R, Descamps, D, Fabre, B, Lidon, P, van de Kruijs, RWE, Boekhout, F, Gullikson, EM, Gaudin, J, Louis, E, Bijkerk, F, Mevel, E, Petit, S, Constant, E & Mairesse, Y 2011, 'Phase characterization of the reflection on an extreme UV multilayer: comparison between attosecond metrology and standing wave measurements', Optics letters, vol. 36, no. 17, pp. 3386-3388. https://doi.org/10.1364/OL.36.003386

Phase characterization of the reflection on an extreme UV multilayer: comparison between attosecond metrology and standing wave measurements. / Loch, R.A.; Dubrouil, A.; Sobierajski, R.; Descamps, D.; Fabre, Benoit; Lidon, P.; van de Kruijs, Robbert Wilhelmus Elisabeth; Boekhout, F.; Gullikson, E.M.; Gaudin, J.; Louis, Eric; Bijkerk, Frederik; Mevel, E.; Petit, S.; Constant, E.; Mairesse, Y.

In: Optics letters, Vol. 36, No. 17, 2011, p. 3386-3388.

Research output: Contribution to journal › Article › Academic › peer-review

TY - JOUR

T1 - Phase characterization of the reflection on an extreme UV multilayer: comparison between attosecond metrology and standing wave measurements

AU - Loch, R.A.

AU - Dubrouil, A.

AU - Sobierajski, R.

AU - Descamps, D.

AU - Fabre, Benoit

AU - Lidon, P.

AU - van de Kruijs, Robbert Wilhelmus Elisabeth

AU - Boekhout, F.

AU - Gullikson, E.M.

AU - Gaudin, J.

AU - Louis, Eric

AU - Bijkerk, Frederik

AU - Mevel, E.

AU - Petit, S.

AU - Constant, E.

AU - Mairesse, Y.

PY - 2011

Y1 - 2011

KW - METIS-277885

U2 - 10.1364/OL.36.003386

DO - 10.1364/OL.36.003386

M3 - Article

VL - 36

SP - 3386

EP - 3388

JO - Optics letters

JF - Optics letters

SN - 0146-9592

IS - 17

ER -