Photon scanning tunneling microscope in combination with a force microscope

M.H.P. Moers, R.G. Tack, N.F. van Hulst, B. Bölger

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The simultaneous operation of a photon scanning tunneling microscope with an atomic force microscope is presented. The use of standard atomic force silicon nitride cantilevers as near-field optical probes offers the possibility to combine the two methods. Vertical forces and torsion are detected simultaneously with the optical near field, which allows a comparison between topography and the optical signal. Images of an optical thin film (indium tin oxide) and a Langmuir-Blodgett layer (pentacosa diynoic acid) show absorption contrast with a lateral resolution of about 30 nm (based o­n edge steepness), which is well below the diffraction limit
Original languageEnglish
Pages (from-to)1254-1257
Number of pages4
JournalJournal of Applied Physics
Issue number3
Publication statusPublished - 1994


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