Photon scanning tunneling microscopy of tailor-made photonic structures

C. Peeters; E. Flück; A.M. Otter; M.L.M. Balistreri; Jeroen P. Korterik; L. Kuipers; N.F. van Hulst

doi:10.1063/1.126903

Photon scanning tunneling microscopy of tailor-made photonic structures

C. Peeters, E. Flück, A.M. Otter, M.L.M. Balistreri, Jeroen P. Korterik, L. Kuipers, N.F. van Hulst

Optical Sciences

Research output: Contribution to journal › Article › Academic › peer-review

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Abstract

Optical field distributions around individually fabricated subwavelength scatterers mapped with a photon scanning tunneling microscope are presented. The photonic structures are produced from ridge waveguides using focused-ion-beam milling. This flexible technique allows us to make single holes and slits of sizes down to 30 nm. A quantitative analysis of the observed optical pattern due to interference between incoming and reflected light yields insight about subwavelength scatterers in waveguides. We conclude that light scattering into high-loss modes of the waveguide occurs

Original language	Undefined
Pages (from-to)	142-144
Number of pages	3
Journal	Applied physics letters
Volume	77
Issue number	1
DOIs	https://doi.org/10.1063/1.126903
Publication status	Published - 2000

Keywords

METIS-128629
IR-23830

Access to Document

10.1063/1.126903

Cite this

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title = "Photon scanning tunneling microscopy of tailor-made photonic structures",

abstract = "Optical field distributions around individually fabricated subwavelength scatterers mapped with a photon scanning tunneling microscope are presented. The photonic structures are produced from ridge waveguides using focused-ion-beam milling. This flexible technique allows us to make single holes and slits of sizes down to 30 nm. A quantitative analysis of the observed optical pattern due to interference between incoming and reflected light yields insight about subwavelength scatterers in waveguides. We conclude that light scattering into high-loss modes of the waveguide occurs",

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AU - Peeters, C.

AU - Flück, E.

AU - Otter, A.M.

AU - Balistreri, M.L.M.

AU - Korterik, Jeroen P.

AU - Kuipers, L.

AU - van Hulst, N.F.

PY - 2000

Y1 - 2000

N2 - Optical field distributions around individually fabricated subwavelength scatterers mapped with a photon scanning tunneling microscope are presented. The photonic structures are produced from ridge waveguides using focused-ion-beam milling. This flexible technique allows us to make single holes and slits of sizes down to 30 nm. A quantitative analysis of the observed optical pattern due to interference between incoming and reflected light yields insight about subwavelength scatterers in waveguides. We conclude that light scattering into high-loss modes of the waveguide occurs

AB - Optical field distributions around individually fabricated subwavelength scatterers mapped with a photon scanning tunneling microscope are presented. The photonic structures are produced from ridge waveguides using focused-ion-beam milling. This flexible technique allows us to make single holes and slits of sizes down to 30 nm. A quantitative analysis of the observed optical pattern due to interference between incoming and reflected light yields insight about subwavelength scatterers in waveguides. We conclude that light scattering into high-loss modes of the waveguide occurs

KW - METIS-128629

KW - IR-23830

U2 - 10.1063/1.126903

DO - 10.1063/1.126903

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