Physical properties and interface studies of YBa2Cu3O7 thin films deposited by laser ablation on S1 (111) with buffer layer

D.H.A. Blank; W.A.M. Aarnink; J. Flokstra; H. Rogalla; A. van Silfhout

doi:10.1016/0022-5088(90)90534-Q

Physical properties and interface studies of YBa₂Cu₃O₇ thin films deposited by laser ablation on S1 (111) with buffer layer

D.H.A. Blank, W.A.M. Aarnink, J. Flokstra, H. Rogalla, A. van Silfhout

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Abstract

The physical properties of laser-deposited YBaCuO on Si using a single buffer layer of ZrO2 and a double layer of NiSi2 and ZrO2 have been studied. The influence of the deposition temperature has been investigated. Interface studies were performed by RBS and SAM. SEM pictures, resistivity and critical current measurements complete this study. The granularity of the films is very important for the diffusion of the Si.

Original language	English
Pages (from-to)	1178-1185
Number of pages	8
Journal	Journal of the less-common metals
Volume	164
Issue number	Part 2
DOIs	https://doi.org/10.1016/0022-5088(90)90534-Q
Publication status	Published - 1990

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title = "Physical properties and interface studies of YBa2Cu3O7 thin films deposited by laser ablation on S1 (111) with buffer layer",

abstract = "The physical properties of laser-deposited YBaCuO on Si using a single buffer layer of ZrO2 and a double layer of NiSi2 and ZrO2 have been studied. The influence of the deposition temperature has been investigated. Interface studies were performed by RBS and SAM. SEM pictures, resistivity and critical current measurements complete this study. The granularity of the films is very important for the diffusion of the Si.",

author = "D.H.A. Blank and W.A.M. Aarnink and J. Flokstra and H. Rogalla and {van Silfhout}, A.",

year = "1990",

doi = "10.1016/0022-5088(90)90534-Q",

language = "English",

volume = "164",

pages = "1178--1185",

journal = "Journal of alloys and compounds",

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T1 - Physical properties and interface studies of YBa2Cu3O7 thin films deposited by laser ablation on S1 (111) with buffer layer

AU - Blank, D.H.A.

AU - Aarnink, W.A.M.

AU - Flokstra, J.

AU - Rogalla, H.

AU - van Silfhout, A.

PY - 1990

Y1 - 1990

N2 - The physical properties of laser-deposited YBaCuO on Si using a single buffer layer of ZrO2 and a double layer of NiSi2 and ZrO2 have been studied. The influence of the deposition temperature has been investigated. Interface studies were performed by RBS and SAM. SEM pictures, resistivity and critical current measurements complete this study. The granularity of the films is very important for the diffusion of the Si.

AB - The physical properties of laser-deposited YBaCuO on Si using a single buffer layer of ZrO2 and a double layer of NiSi2 and ZrO2 have been studied. The influence of the deposition temperature has been investigated. Interface studies were performed by RBS and SAM. SEM pictures, resistivity and critical current measurements complete this study. The granularity of the films is very important for the diffusion of the Si.

U2 - 10.1016/0022-5088(90)90534-Q

DO - 10.1016/0022-5088(90)90534-Q

M3 - Article

VL - 164

SP - 1178

EP - 1185

JO - Journal of alloys and compounds

JF - Journal of alloys and compounds

SN - 0925-8388

IS - Part 2

ER -

Physical properties and interface studies of YBa2Cu3O7 thin films deposited by laser ablation on S1 (111) with buffer layer

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Physical properties and interface studies of YBa₂Cu₃O₇ thin films deposited by laser ablation on S1 (111) with buffer layer