Abstract
In military applications electronic devices play a vital role in the success of a mission. These devices which provide control, guidance, communication, and reconnaissance are critical components in modern unmanned vehicular applications. The current trend is to provide a human interface to control theses systems via portable devices. This trend in modern warfare has increased the complexity of electronic equipment, especially in low volume, highly sophisticated, and dense electronic systems. These modern devices take advantage of the remarkable advances made in low cost commercial electronics. This current movement of using commercial-off-The-shelf (COTS) electronics and devices for military applications has led to concerns about their reliability in harsh battlefield environments. The increase in the use of COTS components lead to the need to improve the reliability of these components by understanding the failure mechanisms due to thermal loads, dynamic vibration, and shock through Physics of Failure (PoF) analyses.
Original language | English |
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Title of host publication | 59th Annual Reliability and Maintainability Symposium, RAMS 2013 |
Subtitle of host publication | proceedings & tutorials : 28-31 January 2013 |
Place of Publication | Piscataway, NJ |
Publisher | IEEE |
ISBN (Electronic) | 978-1-4673-4711-2, 978-1-4673-4710-5 |
ISBN (Print) | 978-1-4673-4709-9 |
DOIs | |
Publication status | Published - 1 Jul 2013 |
Externally published | Yes |
Event | 59th Annual Reliability and Maintainability Symposium, RAMS 2013 - Orlando, United States Duration: 28 Jan 2013 → 31 Jan 2013 Conference number: 59 |
Publication series
Name | Proceedings - Annual Reliability and Maintainability Symposium (RAMS) |
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Publisher | IEEE |
Volume | 2013 |
ISSN (Print) | 0149-144X |
Conference
Conference | 59th Annual Reliability and Maintainability Symposium, RAMS 2013 |
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Abbreviated title | RAMS 2013 |
Country/Territory | United States |
City | Orlando |
Period | 28/01/13 → 31/01/13 |
Keywords
- Drop
- Failure mechanism
- Handheld
- Physics of failure