Physics of failure for portable electronic devices in military applications

Ed Habtour, Benjamin Werner, Adam Hilburn, Harry I. Saraidaridis

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

3 Citations (Scopus)
97 Downloads (Pure)


In military applications electronic devices play a vital role in the success of a mission. These devices which provide control, guidance, communication, and reconnaissance are critical components in modern unmanned vehicular applications. The current trend is to provide a human interface to control theses systems via portable devices. This trend in modern warfare has increased the complexity of electronic equipment, especially in low volume, highly sophisticated, and dense electronic systems. These modern devices take advantage of the remarkable advances made in low cost commercial electronics. This current movement of using commercial-off-The-shelf (COTS) electronics and devices for military applications has led to concerns about their reliability in harsh battlefield environments. The increase in the use of COTS components lead to the need to improve the reliability of these components by understanding the failure mechanisms due to thermal loads, dynamic vibration, and shock through Physics of Failure (PoF) analyses.

Original languageEnglish
Title of host publication59th Annual Reliability and Maintainability Symposium, RAMS 2013
Subtitle of host publicationproceedings & tutorials : 28-31 January 2013
Place of PublicationPiscataway, NJ
ISBN (Electronic)978-1-4673-4711-2, 978-1-4673-4710-5
ISBN (Print)978-1-4673-4709-9
Publication statusPublished - 1 Jul 2013
Externally publishedYes
Event59th Annual Reliability and Maintainability Symposium, RAMS 2013 - Orlando, United States
Duration: 28 Jan 201331 Jan 2013
Conference number: 59

Publication series

NameProceedings - Annual Reliability and Maintainability Symposium (RAMS)
ISSN (Print)0149-144X


Conference59th Annual Reliability and Maintainability Symposium, RAMS 2013
Abbreviated titleRAMS 2013
CountryUnited States


  • Drop
  • Failure mechanism
  • Handheld
  • Physics of failure

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