PID Feedback Based Backtrace Method

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings 8th IEEE International Mixed-Signal Testing Workshop
    Place of PublicationMontreux, Switzerland
    Pages147-152
    Publication statusPublished - 18 Jun 2002

    Keywords

    • METIS-207851

    Cite this

    Fang, L., & Kerkhoff, H. G. (2002). PID Feedback Based Backtrace Method. In Proceedings 8th IEEE International Mixed-Signal Testing Workshop (pp. 147-152). Montreux, Switzerland.
    Fang, L. ; Kerkhoff, Hans G. / PID Feedback Based Backtrace Method. Proceedings 8th IEEE International Mixed-Signal Testing Workshop. Montreux, Switzerland, 2002. pp. 147-152
    @inproceedings{fcfe9e97fb024d13a360c2532b123eff,
    title = "PID Feedback Based Backtrace Method",
    keywords = "METIS-207851",
    author = "L. Fang and Kerkhoff, {Hans G.}",
    year = "2002",
    month = "6",
    day = "18",
    language = "Undefined",
    pages = "147--152",
    booktitle = "Proceedings 8th IEEE International Mixed-Signal Testing Workshop",

    }

    Fang, L & Kerkhoff, HG 2002, PID Feedback Based Backtrace Method. in Proceedings 8th IEEE International Mixed-Signal Testing Workshop. Montreux, Switzerland, pp. 147-152.

    PID Feedback Based Backtrace Method. / Fang, L.; Kerkhoff, Hans G.

    Proceedings 8th IEEE International Mixed-Signal Testing Workshop. Montreux, Switzerland, 2002. p. 147-152.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    TY - GEN

    T1 - PID Feedback Based Backtrace Method

    AU - Fang, L.

    AU - Kerkhoff, Hans G.

    PY - 2002/6/18

    Y1 - 2002/6/18

    KW - METIS-207851

    M3 - Conference contribution

    SP - 147

    EP - 152

    BT - Proceedings 8th IEEE International Mixed-Signal Testing Workshop

    CY - Montreux, Switzerland

    ER -

    Fang L, Kerkhoff HG. PID Feedback Based Backtrace Method. In Proceedings 8th IEEE International Mixed-Signal Testing Workshop. Montreux, Switzerland. 2002. p. 147-152