Piezoelectric non-linearity in PbSc0.5Ta0.5O3 thin films

A. Chopra, Y. Kim, M. Alexe, D. Hesse

Research output: Contribution to journalArticleAcademicpeer-review

2 Citations (Scopus)

Abstract

Epitaxial (001)-oriented PbSc0.5Ta0.5O3 (PST) thin films were deposited by pulsed laser deposition. Local piezoelectric investigations performed by piezoelectric force microscopy show a dual slope for the piezoelectric coefficient. A piezoelectric coefficient of 3 pm/V was observed at voltages up to 0.8 V. However, at voltages above 0.8 V, there is a steep increase in piezoelectric coefficient mounting to 23.2 pm/V. This nonlinear piezoelectric response was observed to be irreversible in nature. In order to better understand this nonlinear behavior, voltage dependent dielectric constant measurements were performed. These confirmed that the piezoelectric non-linearity is indeed a manifestation of a dielectric non-linearity. In contrast to classical ferroelectric systems, the observed dielectric non-linearity in this relaxor material cannot be explained by the Rayleigh model. Thus the dielectric non-linearity in the PST films is tentatively explained as a manifestation of a percolation of the polar nano regions
Original languageEnglish
Pages (from-to)1229-1233
JournalJournal of physics and chemistry of solids
Volume75
Issue number11
DOIs
Publication statusPublished - 2014

Keywords

  • IR-96649
  • METIS-311056

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