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Dive into the research topics of '"Plasma charging damage induced by a power ramp down step in the end of plasma enhanced chemical vapour deposition (PECVD) process'. Together they form a unique fingerprint.- Sort by
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Zhichun Wang, Jan Ackaert, Cora Salm, F.G. Kuper, Klara Bessemans, Eddy de Backer
Research output: Contribution to conference › Paper