Polar-discontinuity-retaining A-site intermixing and vacancies at SrTiO3/LaAlO3 interfaces

V. Vonk, J. Huijben, D. Kukuruznyak, A. Stierle, H. Hilgenkamp, Alexander Brinkman, Sybolt Harkema

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Abstract

Our anomalous surface x-ray diffraction study of the interface between SrTiO3(001) substrates and thin polar films of LaAlO3 shows La/Sr interdiffusion leading to neutrally charged Sr1−1.5xLaxO layers. From a thickness of two unit cells, the LaAlO3 film's interior retains its polar stacking sequence, which is compensated by a cationic compositional change of the substrate's terminating TiO2 layer. While such valence-retaining A-site intermixing does not resolve the polar catastrophe, it may be a general feature at oxide interfaces influencing the electronic and magnetic properties
Original languageEnglish
Article number045401
Pages (from-to)1-5
Number of pages5
JournalPhysical Review B (Condensed Matter and Materials Physics)
Volume85
Issue number4
DOIs
Publication statusPublished - 2012

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retaining
Vacancies
discontinuity
Substrates
stopping
Electronic properties
Oxides
Magnetic properties
x ray diffraction
Diffraction
magnetic properties
valence
X rays
oxides
cells
electronics
strontium titanium oxide

Keywords

  • METIS-286923
  • IR-82009

Cite this

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title = "Polar-discontinuity-retaining A-site intermixing and vacancies at SrTiO3/LaAlO3 interfaces",
abstract = "Our anomalous surface x-ray diffraction study of the interface between SrTiO3(001) substrates and thin polar films of LaAlO3 shows La/Sr interdiffusion leading to neutrally charged Sr1−1.5xLaxO layers. From a thickness of two unit cells, the LaAlO3 film's interior retains its polar stacking sequence, which is compensated by a cationic compositional change of the substrate's terminating TiO2 layer. While such valence-retaining A-site intermixing does not resolve the polar catastrophe, it may be a general feature at oxide interfaces influencing the electronic and magnetic properties",
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year = "2012",
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language = "English",
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Polar-discontinuity-retaining A-site intermixing and vacancies at SrTiO3/LaAlO3 interfaces. / Vonk, V.; Huijben, J.; Kukuruznyak, D.; Stierle, A.; Hilgenkamp, H.; Brinkman, Alexander; Harkema, Sybolt.

In: Physical Review B (Condensed Matter and Materials Physics), Vol. 85, No. 4, 045401, 2012, p. 1-5.

Research output: Contribution to journalArticleAcademicpeer-review

TY - JOUR

T1 - Polar-discontinuity-retaining A-site intermixing and vacancies at SrTiO3/LaAlO3 interfaces

AU - Vonk, V.

AU - Huijben, J.

AU - Kukuruznyak, D.

AU - Stierle, A.

AU - Hilgenkamp, H.

AU - Brinkman, Alexander

AU - Harkema, Sybolt

PY - 2012

Y1 - 2012

N2 - Our anomalous surface x-ray diffraction study of the interface between SrTiO3(001) substrates and thin polar films of LaAlO3 shows La/Sr interdiffusion leading to neutrally charged Sr1−1.5xLaxO layers. From a thickness of two unit cells, the LaAlO3 film's interior retains its polar stacking sequence, which is compensated by a cationic compositional change of the substrate's terminating TiO2 layer. While such valence-retaining A-site intermixing does not resolve the polar catastrophe, it may be a general feature at oxide interfaces influencing the electronic and magnetic properties

AB - Our anomalous surface x-ray diffraction study of the interface between SrTiO3(001) substrates and thin polar films of LaAlO3 shows La/Sr interdiffusion leading to neutrally charged Sr1−1.5xLaxO layers. From a thickness of two unit cells, the LaAlO3 film's interior retains its polar stacking sequence, which is compensated by a cationic compositional change of the substrate's terminating TiO2 layer. While such valence-retaining A-site intermixing does not resolve the polar catastrophe, it may be a general feature at oxide interfaces influencing the electronic and magnetic properties

KW - METIS-286923

KW - IR-82009

U2 - 10.1103/PhysRevB.85.045401

DO - 10.1103/PhysRevB.85.045401

M3 - Article

VL - 85

SP - 1

EP - 5

JO - Physical review B: Covering condensed matter and materials physics

JF - Physical review B: Covering condensed matter and materials physics

SN - 2469-9950

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