Polarization analysis of neutron reflectometry on non-magnetic structures deposited on a magnetic layer

R. W.E. Van De Kruijs, H. Fredrikze, M. Th Rekveldt

Research output: Contribution to journalConference articleAcademicpeer-review

Abstract

Polarized neutron reflectometry calculations for a non-magnetic bilayer on top of a substrate with a thin magnetic film are performed to investigate the sensitivity of spin-flipped neutrons to changes in Γ(z). Non-polarized reflectivity curves show little response to small variations of Γ(z). Although non-spin-flipped curves are similar to the case without polarization analysis, spin-flipped reflectivities show much larger sensitivity to small changes in Γ(z). Calculations for the same system with a different second non-magnetic layer thickness again show large sensitivity. Both peak position and peak intensity change dramatically when model parameters are changed.

Original languageEnglish
Pages (from-to)642-643
Number of pages2
JournalPhysica B: Condensed Matter
Volume276-278
DOIs
Publication statusPublished - Mar 2000
Externally publishedYes
Event2nd European Conference on Neutron Scattering, ECNS 1999 - Budapest, Hungary
Duration: 1 Sept 19994 Sept 1999
Conference number: 2

Keywords

  • n/a OA procedure

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