Abstract
Original language | English |
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Title of host publication | Microresonators As Building Blocks For VLSI Photonics |
Subtitle of host publication | International School of Quantum Electronics, 39th Course |
Editors | Francesco Michelotti, Alfred Driessen, Mario Bertolotti |
Place of Publication | Melville, NY, USA |
Publisher | American Institute of Physics |
Pages | 415-416 |
Number of pages | 2 |
ISBN (Print) | 0-7354-0184-5 |
DOIs | |
Publication status | Published - 18 Oct 2004 |
Publication series
Name | AIP Conference Proceedings |
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Publisher | AIP |
Volume | 709 |
ISSN (Print) | 0094-243X |
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Polarization Conversion in Vertically Coupled Si3N4/SiO2 Microring Resonators. / Larciprete, Maria Cristina; Klein, Edwin J.; Belardini, Alessandro; Geuzebroek, Douwe H.; Driessen, Alfred; Michelotti, Francesco.
Microresonators As Building Blocks For VLSI Photonics: International School of Quantum Electronics, 39th Course. ed. / Francesco Michelotti; Alfred Driessen; Mario Bertolotti. Melville, NY, USA : American Institute of Physics, 2004. p. 415-416 (AIP Conference Proceedings; Vol. 709).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
TY - GEN
T1 - Polarization Conversion in Vertically Coupled Si3N4/SiO2 Microring Resonators
AU - Larciprete, Maria Cristina
AU - Klein, Edwin J.
AU - Belardini, Alessandro
AU - Geuzebroek, Douwe H.
AU - Driessen, Alfred
AU - Michelotti, Francesco
PY - 2004/10/18
Y1 - 2004/10/18
N2 - Vertically coupled Si3N4/SiO2 passive microring resonators having different lateral distance from the straight forward waveguide have been investigated. The transmitted and dropped power of the devices was measured. Specifically, by means of input and output polarizers, the polarization conversion between TE and TM mode has been investigated. Main cavity parameters, i.e. finesse and free spectral range have been reconstructed from experimental data. Finally, the results on TE/TM polarization conversion is briefly explained.
AB - Vertically coupled Si3N4/SiO2 passive microring resonators having different lateral distance from the straight forward waveguide have been investigated. The transmitted and dropped power of the devices was measured. Specifically, by means of input and output polarizers, the polarization conversion between TE and TM mode has been investigated. Main cavity parameters, i.e. finesse and free spectral range have been reconstructed from experimental data. Finally, the results on TE/TM polarization conversion is briefly explained.
U2 - 10.1063/1.1764035
DO - 10.1063/1.1764035
M3 - Conference contribution
SN - 0-7354-0184-5
T3 - AIP Conference Proceedings
SP - 415
EP - 416
BT - Microresonators As Building Blocks For VLSI Photonics
A2 - Michelotti, Francesco
A2 - Driessen, Alfred
A2 - Bertolotti, Mario
PB - American Institute of Physics
CY - Melville, NY, USA
ER -