Polarization Conversion in Vertically Coupled Si3N4/SiO2 Microring Resonators

Maria Cristina Larciprete, Edwin J. Klein, Alessandro Belardini, Douwe H. Geuzebroek, Alfred Driessen, Francesco Michelotti

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    1 Citation (Scopus)

    Abstract

    Vertically coupled Si3N4/SiO2 passive microring resonators having different lateral distance from the straight forward waveguide have been investigated. The transmitted and dropped power of the devices was measured. Specifically, by means of input and output polarizers, the polarization conversion between TE and TM mode has been investigated. Main cavity parameters, i.e. finesse and free spectral range have been reconstructed from experimental data. Finally, the results on TE/TM polarization conversion is briefly explained.
    Original languageEnglish
    Title of host publicationMicroresonators As Building Blocks For VLSI Photonics
    Subtitle of host publicationInternational School of Quantum Electronics, 39th Course
    EditorsFrancesco Michelotti, Alfred Driessen, Mario Bertolotti
    Place of PublicationMelville, NY, USA
    PublisherAmerican Institute of Physics
    Pages415-416
    Number of pages2
    ISBN (Print)0-7354-0184-5
    DOIs
    Publication statusPublished - 18 Oct 2004

    Publication series

    NameAIP Conference Proceedings
    PublisherAIP
    Volume709
    ISSN (Print)0094-243X

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    resonators
    polarization
    polarizers
    waveguides
    cavities
    output

    Cite this

    Larciprete, M. C., Klein, E. J., Belardini, A., Geuzebroek, D. H., Driessen, A., & Michelotti, F. (2004). Polarization Conversion in Vertically Coupled Si3N4/SiO2 Microring Resonators. In F. Michelotti, A. Driessen, & M. Bertolotti (Eds.), Microresonators As Building Blocks For VLSI Photonics: International School of Quantum Electronics, 39th Course (pp. 415-416). (AIP Conference Proceedings; Vol. 709). Melville, NY, USA: American Institute of Physics. https://doi.org/10.1063/1.1764035
    Larciprete, Maria Cristina ; Klein, Edwin J. ; Belardini, Alessandro ; Geuzebroek, Douwe H. ; Driessen, Alfred ; Michelotti, Francesco. / Polarization Conversion in Vertically Coupled Si3N4/SiO2 Microring Resonators. Microresonators As Building Blocks For VLSI Photonics: International School of Quantum Electronics, 39th Course. editor / Francesco Michelotti ; Alfred Driessen ; Mario Bertolotti. Melville, NY, USA : American Institute of Physics, 2004. pp. 415-416 (AIP Conference Proceedings).
    @inproceedings{d4e0fab5693f47b890546d057e9ce415,
    title = "Polarization Conversion in Vertically Coupled Si3N4/SiO2 Microring Resonators",
    abstract = "Vertically coupled Si3N4/SiO2 passive microring resonators having different lateral distance from the straight forward waveguide have been investigated. The transmitted and dropped power of the devices was measured. Specifically, by means of input and output polarizers, the polarization conversion between TE and TM mode has been investigated. Main cavity parameters, i.e. finesse and free spectral range have been reconstructed from experimental data. Finally, the results on TE/TM polarization conversion is briefly explained.",
    author = "Larciprete, {Maria Cristina} and Klein, {Edwin J.} and Alessandro Belardini and Geuzebroek, {Douwe H.} and Alfred Driessen and Francesco Michelotti",
    year = "2004",
    month = "10",
    day = "18",
    doi = "10.1063/1.1764035",
    language = "English",
    isbn = "0-7354-0184-5",
    series = "AIP Conference Proceedings",
    publisher = "American Institute of Physics",
    pages = "415--416",
    editor = "Francesco Michelotti and Alfred Driessen and Bertolotti, {Mario }",
    booktitle = "Microresonators As Building Blocks For VLSI Photonics",
    address = "United States",

    }

    Larciprete, MC, Klein, EJ, Belardini, A, Geuzebroek, DH, Driessen, A & Michelotti, F 2004, Polarization Conversion in Vertically Coupled Si3N4/SiO2 Microring Resonators. in F Michelotti, A Driessen & M Bertolotti (eds), Microresonators As Building Blocks For VLSI Photonics: International School of Quantum Electronics, 39th Course. AIP Conference Proceedings, vol. 709, American Institute of Physics, Melville, NY, USA, pp. 415-416. https://doi.org/10.1063/1.1764035

    Polarization Conversion in Vertically Coupled Si3N4/SiO2 Microring Resonators. / Larciprete, Maria Cristina; Klein, Edwin J.; Belardini, Alessandro; Geuzebroek, Douwe H.; Driessen, Alfred; Michelotti, Francesco.

    Microresonators As Building Blocks For VLSI Photonics: International School of Quantum Electronics, 39th Course. ed. / Francesco Michelotti; Alfred Driessen; Mario Bertolotti. Melville, NY, USA : American Institute of Physics, 2004. p. 415-416 (AIP Conference Proceedings; Vol. 709).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    TY - GEN

    T1 - Polarization Conversion in Vertically Coupled Si3N4/SiO2 Microring Resonators

    AU - Larciprete, Maria Cristina

    AU - Klein, Edwin J.

    AU - Belardini, Alessandro

    AU - Geuzebroek, Douwe H.

    AU - Driessen, Alfred

    AU - Michelotti, Francesco

    PY - 2004/10/18

    Y1 - 2004/10/18

    N2 - Vertically coupled Si3N4/SiO2 passive microring resonators having different lateral distance from the straight forward waveguide have been investigated. The transmitted and dropped power of the devices was measured. Specifically, by means of input and output polarizers, the polarization conversion between TE and TM mode has been investigated. Main cavity parameters, i.e. finesse and free spectral range have been reconstructed from experimental data. Finally, the results on TE/TM polarization conversion is briefly explained.

    AB - Vertically coupled Si3N4/SiO2 passive microring resonators having different lateral distance from the straight forward waveguide have been investigated. The transmitted and dropped power of the devices was measured. Specifically, by means of input and output polarizers, the polarization conversion between TE and TM mode has been investigated. Main cavity parameters, i.e. finesse and free spectral range have been reconstructed from experimental data. Finally, the results on TE/TM polarization conversion is briefly explained.

    U2 - 10.1063/1.1764035

    DO - 10.1063/1.1764035

    M3 - Conference contribution

    SN - 0-7354-0184-5

    T3 - AIP Conference Proceedings

    SP - 415

    EP - 416

    BT - Microresonators As Building Blocks For VLSI Photonics

    A2 - Michelotti, Francesco

    A2 - Driessen, Alfred

    A2 - Bertolotti, Mario

    PB - American Institute of Physics

    CY - Melville, NY, USA

    ER -

    Larciprete MC, Klein EJ, Belardini A, Geuzebroek DH, Driessen A, Michelotti F. Polarization Conversion in Vertically Coupled Si3N4/SiO2 Microring Resonators. In Michelotti F, Driessen A, Bertolotti M, editors, Microresonators As Building Blocks For VLSI Photonics: International School of Quantum Electronics, 39th Course. Melville, NY, USA: American Institute of Physics. 2004. p. 415-416. (AIP Conference Proceedings). https://doi.org/10.1063/1.1764035