Abstract
Vertically coupled Si3N4/SiO2 passive microring resonators having different lateral distance from the straight forward waveguide have been investigated. The transmitted and dropped power of the devices was measured. Specifically, by means of input and output polarizers, the polarization conversion between TE and TM mode has been investigated. Main cavity parameters, i.e. finesse and free spectral range have been reconstructed from experimental data. Finally, the results on TE/TM polarization conversion is briefly explained.
Original language | English |
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Title of host publication | Microresonators As Building Blocks For VLSI Photonics |
Subtitle of host publication | International School of Quantum Electronics, 39th Course |
Editors | Francesco Michelotti, Alfred Driessen, Mario Bertolotti |
Place of Publication | Melville, NY, USA |
Publisher | American Institute of Physics |
Pages | 415-416 |
Number of pages | 2 |
ISBN (Print) | 0-7354-0184-5 |
DOIs | |
Publication status | Published - 18 Oct 2004 |
Event | Microresonators as building blocks for VLSI photonics 2003 : 39th Course International School of Quantum Electronics - Erice, Italy Duration: 18 Oct 2003 → 25 Oct 2003 |
Publication series
Name | AIP Conference Proceedings |
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Publisher | AIP |
Volume | 709 |
ISSN (Print) | 0094-243X |
Conference
Conference | Microresonators as building blocks for VLSI photonics 2003 |
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Country/Territory | Italy |
City | Erice |
Period | 18/10/03 → 25/10/03 |