Polarization Conversion in Vertically Coupled Si3N4/SiO2 Microring Resonators

Maria Cristina Larciprete, Edwin J. Klein, Alessandro Belardini, Douwe H. Geuzebroek, Alfred Driessen, Francesco Michelotti

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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    Abstract

    Vertically coupled Si3N4/SiO2 passive microring resonators having different lateral distance from the straight forward waveguide have been investigated. The transmitted and dropped power of the devices was measured. Specifically, by means of input and output polarizers, the polarization conversion between TE and TM mode has been investigated. Main cavity parameters, i.e. finesse and free spectral range have been reconstructed from experimental data. Finally, the results on TE/TM polarization conversion is briefly explained.
    Original languageEnglish
    Title of host publicationMicroresonators As Building Blocks For VLSI Photonics
    Subtitle of host publicationInternational School of Quantum Electronics, 39th Course
    EditorsFrancesco Michelotti, Alfred Driessen, Mario Bertolotti
    Place of PublicationMelville, NY, USA
    PublisherAmerican Institute of Physics
    Pages415-416
    Number of pages2
    ISBN (Print)0-7354-0184-5
    DOIs
    Publication statusPublished - 18 Oct 2004

    Publication series

    NameAIP Conference Proceedings
    PublisherAIP
    Volume709
    ISSN (Print)0094-243X

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    Cite this

    Larciprete, M. C., Klein, E. J., Belardini, A., Geuzebroek, D. H., Driessen, A., & Michelotti, F. (2004). Polarization Conversion in Vertically Coupled Si3N4/SiO2 Microring Resonators. In F. Michelotti, A. Driessen, & M. Bertolotti (Eds.), Microresonators As Building Blocks For VLSI Photonics: International School of Quantum Electronics, 39th Course (pp. 415-416). (AIP Conference Proceedings; Vol. 709). Melville, NY, USA: American Institute of Physics. https://doi.org/10.1063/1.1764035