Polarization Conversion in Vertically Coupled Si3N4/SiO2 Microring Resonators

Maria Cristina Larciprete; Edwin J. Klein; Alessandro Belardini; Douwe H. Geuzebroek; Alfred Driessen; Francesco Michelotti

doi:10.1063/1.1764035

Polarization Conversion in Vertically Coupled Si₃N₄/SiO₂ Microring Resonators

Maria Cristina Larciprete, Edwin J. Klein, Alessandro Belardini, Douwe H. Geuzebroek, Alfred Driessen, Francesco Michelotti

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

1 Citation (Scopus)

Abstract

Vertically coupled Si₃N₄/SiO₂ passive microring resonators having different lateral distance from the straight forward waveguide have been investigated. The transmitted and dropped power of the devices was measured. Specifically, by means of input and output polarizers, the polarization conversion between TE and TM mode has been investigated. Main cavity parameters, i.e. finesse and free spectral range have been reconstructed from experimental data. Finally, the results on TE/TM polarization conversion is briefly explained.

Original language	English
Title of host publication	Microresonators As Building Blocks For VLSI Photonics
Subtitle of host publication	International School of Quantum Electronics, 39th Course
Editors	Francesco Michelotti, Alfred Driessen, Mario Bertolotti
Place of Publication	Melville, NY, USA
Publisher	American Institute of Physics
Pages	415-416
Number of pages	2
ISBN (Print)	0-7354-0184-5
DOIs	https://doi.org/10.1063/1.1764035
Publication status	Published - 18 Oct 2004

Publication series

Name	AIP Conference Proceedings
Publisher	AIP
Volume	709
ISSN (Print)	0094-243X

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Cite this

Larciprete, M. C., Klein, E. J., Belardini, A., Geuzebroek, D. H., Driessen, A., & Michelotti, F. (2004). Polarization Conversion in Vertically Coupled Si₃N₄/SiO₂ Microring Resonators. In F. Michelotti, A. Driessen, & M. Bertolotti (Eds.), Microresonators As Building Blocks For VLSI Photonics: International School of Quantum Electronics, 39th Course (pp. 415-416). (AIP Conference Proceedings; Vol. 709). Melville, NY, USA: American Institute of Physics. https://doi.org/10.1063/1.1764035

Larciprete, Maria Cristina ; Klein, Edwin J. ; Belardini, Alessandro ; Geuzebroek, Douwe H. ; Driessen, Alfred ; Michelotti, Francesco. / Polarization Conversion in Vertically Coupled Si₃N₄/SiO₂ Microring Resonators. Microresonators As Building Blocks For VLSI Photonics: International School of Quantum Electronics, 39th Course. editor / Francesco Michelotti ; Alfred Driessen ; Mario Bertolotti. Melville, NY, USA : American Institute of Physics, 2004. pp. 415-416 (AIP Conference Proceedings).

@inproceedings{d4e0fab5693f47b890546d057e9ce415,

title = "Polarization Conversion in Vertically Coupled Si3N4/SiO2 Microring Resonators",

abstract = "Vertically coupled Si3N4/SiO2 passive microring resonators having different lateral distance from the straight forward waveguide have been investigated. The transmitted and dropped power of the devices was measured. Specifically, by means of input and output polarizers, the polarization conversion between TE and TM mode has been investigated. Main cavity parameters, i.e. finesse and free spectral range have been reconstructed from experimental data. Finally, the results on TE/TM polarization conversion is briefly explained.",

author = "Larciprete, {Maria Cristina} and Klein, {Edwin J.} and Alessandro Belardini and Geuzebroek, {Douwe H.} and Alfred Driessen and Francesco Michelotti",

year = "2004",

month = "10",

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doi = "10.1063/1.1764035",

language = "English",

isbn = "0-7354-0184-5",

series = "AIP Conference Proceedings",

publisher = "American Institute of Physics",

pages = "415--416",

editor = "Francesco Michelotti and Alfred Driessen and Bertolotti, {Mario }",

booktitle = "Microresonators As Building Blocks For VLSI Photonics",

address = "United States",

}

Larciprete, MC, Klein, EJ, Belardini, A, Geuzebroek, DH, Driessen, A & Michelotti, F 2004, Polarization Conversion in Vertically Coupled Si₃N₄/SiO₂ Microring Resonators. in F Michelotti, A Driessen & M Bertolotti (eds), Microresonators As Building Blocks For VLSI Photonics: International School of Quantum Electronics, 39th Course. AIP Conference Proceedings, vol. 709, American Institute of Physics, Melville, NY, USA, pp. 415-416. https://doi.org/10.1063/1.1764035

Polarization Conversion in Vertically Coupled Si₃N₄/SiO₂ Microring Resonators. / Larciprete, Maria Cristina; Klein, Edwin J.; Belardini, Alessandro; Geuzebroek, Douwe H.; Driessen, Alfred; Michelotti, Francesco.

Microresonators As Building Blocks For VLSI Photonics: International School of Quantum Electronics, 39th Course. ed. / Francesco Michelotti; Alfred Driessen; Mario Bertolotti. Melville, NY, USA : American Institute of Physics, 2004. p. 415-416 (AIP Conference Proceedings; Vol. 709).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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T1 - Polarization Conversion in Vertically Coupled Si3N4/SiO2 Microring Resonators

AU - Larciprete, Maria Cristina

AU - Klein, Edwin J.

AU - Belardini, Alessandro

AU - Geuzebroek, Douwe H.

AU - Driessen, Alfred

AU - Michelotti, Francesco

PY - 2004/10/18

Y1 - 2004/10/18

N2 - Vertically coupled Si3N4/SiO2 passive microring resonators having different lateral distance from the straight forward waveguide have been investigated. The transmitted and dropped power of the devices was measured. Specifically, by means of input and output polarizers, the polarization conversion between TE and TM mode has been investigated. Main cavity parameters, i.e. finesse and free spectral range have been reconstructed from experimental data. Finally, the results on TE/TM polarization conversion is briefly explained.

AB - Vertically coupled Si3N4/SiO2 passive microring resonators having different lateral distance from the straight forward waveguide have been investigated. The transmitted and dropped power of the devices was measured. Specifically, by means of input and output polarizers, the polarization conversion between TE and TM mode has been investigated. Main cavity parameters, i.e. finesse and free spectral range have been reconstructed from experimental data. Finally, the results on TE/TM polarization conversion is briefly explained.

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DO - 10.1063/1.1764035

M3 - Conference contribution

SN - 0-7354-0184-5

T3 - AIP Conference Proceedings

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BT - Microresonators As Building Blocks For VLSI Photonics

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PB - American Institute of Physics

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ER -

Larciprete MC, Klein EJ, Belardini A, Geuzebroek DH, Driessen A, Michelotti F. Polarization Conversion in Vertically Coupled Si₃N₄/SiO₂ Microring Resonators. In Michelotti F, Driessen A, Bertolotti M, editors, Microresonators As Building Blocks For VLSI Photonics: International School of Quantum Electronics, 39th Course. Melville, NY, USA: American Institute of Physics. 2004. p. 415-416. (AIP Conference Proceedings). https://doi.org/10.1063/1.1764035

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10.1063/1.1764035