Polarization dependent EXAFS studies of chemical and structural anisotropy in sputter deposited Co78Cr22 films

K.M. Kemner, V.G. Harris, W.T. Elam, J.C. Lodder

    Research output: Contribution to journalArticleAcademicpeer-review

    28 Downloads (Pure)
    Original languageUndefined
    Pages (from-to)4017-4019
    Number of pages3
    JournalIEEE transactions on magnetics
    Volume30
    Publication statusPublished - 1994

    Keywords

    • SMI-TST: From 2006 in EWI-TST
    • SMI-MAT: MATERIALS
    • IR-66105
    • EWI-5477

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