Polarization dependent EXAFS studies of chemical and structural anisotropy in sputter deposited Co78Cr22 films

Polarization dependent EXAFS studies of chemical and structural anisotropy in sputter deposited Co₇₈Cr₂₂ films

K.M. Kemner, V.G. Harris, W.T. Elam, J.C. Lodder

Research output: Contribution to journal › Article › Academic › peer-review

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Original language	Undefined
Pages (from-to)	4017-4019
Number of pages	3
Journal	IEEE transactions on magnetics
Volume	30
Publication status	Published - 1994

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title = "Polarization dependent EXAFS studies of chemical and structural anisotropy in sputter deposited Co78Cr22 films",

keywords = "SMI-TST: From 2006 in EWI-TST, SMI-MAT: MATERIALS, IR-66105, EWI-5477",

author = "K.M. Kemner and V.G. Harris and W.T. Elam and J.C. Lodder",

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year = "1994",

language = "Undefined",

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journal = "IEEE transactions on magnetics",

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T1 - Polarization dependent EXAFS studies of chemical and structural anisotropy in sputter deposited Co78Cr22 films

AU - Kemner, K.M.

AU - Harris, V.G.

AU - Elam, W.T.

AU - Lodder, J.C.

N1 - Imported from SMI Reference manager

PY - 1994

Y1 - 1994

KW - SMI-TST: From 2006 in EWI-TST

KW - SMI-MAT: MATERIALS

KW - IR-66105

KW - EWI-5477

M3 - Article

SN - 0018-9464

VL - 30

SP - 4017

EP - 4019

JO - IEEE transactions on magnetics

JF - IEEE transactions on magnetics

ER -