Polarization dependent EXAFS studies of chemical and structural anisotropy in sputter deposited Co78Cr22 films

K.M. Kemner, V.G. Harris, W.T. Elam, J.C. Lodder

    Research output: Contribution to journalArticleAcademicpeer-review

    7 Citations (Scopus)
    Original languageUndefined
    Pages (from-to)4017-4019
    Number of pages3
    JournalIEEE transactions on magnetics
    Volume30
    Publication statusPublished - 1994

    Keywords

    • METIS-111934

    Cite this

    Kemner, K.M. ; Harris, V.G. ; Elam, W.T. ; Lodder, J.C. / Polarization dependent EXAFS studies of chemical and structural anisotropy in sputter deposited Co78Cr22 films. In: IEEE transactions on magnetics. 1994 ; Vol. 30. pp. 4017-4019.
    @article{1aaf15b8ce214d699c68b23d9978920b,
    title = "Polarization dependent EXAFS studies of chemical and structural anisotropy in sputter deposited Co78Cr22 films",
    keywords = "METIS-111934",
    author = "K.M. Kemner and V.G. Harris and W.T. Elam and J.C. Lodder",
    year = "1994",
    language = "Undefined",
    volume = "30",
    pages = "4017--4019",
    journal = "IEEE transactions on magnetics",
    issn = "0018-9464",
    publisher = "IEEE",

    }

    Polarization dependent EXAFS studies of chemical and structural anisotropy in sputter deposited Co78Cr22 films. / Kemner, K.M.; Harris, V.G.; Elam, W.T.; Lodder, J.C.

    In: IEEE transactions on magnetics, Vol. 30, 1994, p. 4017-4019.

    Research output: Contribution to journalArticleAcademicpeer-review

    TY - JOUR

    T1 - Polarization dependent EXAFS studies of chemical and structural anisotropy in sputter deposited Co78Cr22 films

    AU - Kemner, K.M.

    AU - Harris, V.G.

    AU - Elam, W.T.

    AU - Lodder, J.C.

    PY - 1994

    Y1 - 1994

    KW - METIS-111934

    M3 - Article

    VL - 30

    SP - 4017

    EP - 4019

    JO - IEEE transactions on magnetics

    JF - IEEE transactions on magnetics

    SN - 0018-9464

    ER -