Polarization switching in BaTiO3 thin films measured by X-ray diffraction exploiting anomalous dispersion

S.J. van Reeuwijk, K. Karakaya, H. Graafsma, Sybolt Harkema

Research output: Contribution to journalArticleAcademicpeer-review

9 Citations (Scopus)
Original languageUndefined
Pages (from-to)193-199
Number of pages7
JournalJournal of applied crystallography
Volume37
Publication statusPublished - 2004

Keywords

  • METIS-218397

Cite this

van Reeuwijk, S.J. ; Karakaya, K. ; Graafsma, H. ; Harkema, Sybolt. / Polarization switching in BaTiO3 thin films measured by X-ray diffraction exploiting anomalous dispersion. In: Journal of applied crystallography. 2004 ; Vol. 37. pp. 193-199.
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year = "2004",
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volume = "37",
pages = "193--199",
journal = "Journal of applied crystallography",
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publisher = "International Union of Crystallography",

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Polarization switching in BaTiO3 thin films measured by X-ray diffraction exploiting anomalous dispersion. / van Reeuwijk, S.J.; Karakaya, K.; Graafsma, H.; Harkema, Sybolt.

In: Journal of applied crystallography, Vol. 37, 2004, p. 193-199.

Research output: Contribution to journalArticleAcademicpeer-review

TY - JOUR

T1 - Polarization switching in BaTiO3 thin films measured by X-ray diffraction exploiting anomalous dispersion

AU - van Reeuwijk, S.J.

AU - Karakaya, K.

AU - Graafsma, H.

AU - Harkema, Sybolt

PY - 2004

Y1 - 2004

KW - METIS-218397

M3 - Article

VL - 37

SP - 193

EP - 199

JO - Journal of applied crystallography

JF - Journal of applied crystallography

SN - 0021-8898

ER -