Polarized neutron reflectometry on Co-Cr

A. van der Graaf*, H. Fredrikze, P. de Haan, M.Th. Rekveldt, J.C. Lodder

*Corresponding author for this work

    Research output: Contribution to journalArticleAcademicpeer-review

    2 Citations (Scopus)
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    Abstract

    Polarized neutron reflectivity of a Co-Cr film on silicon with the easy axis of magnetization perpendicular to the plane has been measured at in-plane magnetic fields of various magnitudes. The obtained data can be well described assuming a constant atomic density and a gradual increase of the in-plane magnetization with depth at the different magnetic fields.
    Original languageEnglish
    Pages (from-to)695-696
    Number of pages5
    JournalJournal of magnetism and magnetic materials
    Volume140-144
    Issue number1
    DOIs
    Publication statusPublished - 1995
    EventInternational Conference on Magnetism, INTERMAG 1994 - Warsaw, Poland
    Duration: 22 Aug 199426 Aug 1994

    Keywords

    • SMI-TST: From 2006 in EWI-TST
    • SMI-MAT: MATERIALS

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