Polarized neutron reflectivity of a Co-Cr film on silicon with the easy axis of magnetization perpendicular to the plane has been measured at in-plane magnetic fields of various magnitudes. The obtained data can be well described assuming a constant atomic density and a gradual increase of the in-plane magnetization with depth at the different magnetic fields.
|Number of pages||5|
|Journal||Journal of magnetism and magnetic materials|
|Publication status||Published - 1995|
|Event||International Conference on Magnetism, INTERMAG 1994 - Warsaw, Poland|
Duration: 22 Aug 1994 → 26 Aug 1994
- SMI-TST: From 2006 in EWI-TST
- SMI-MAT: MATERIALS