Polarized neutron reflectometry on Co-Cr

A. van der Graaf*, H. Fredrikze, P. de Haan, M.Th. Rekveldt, J.C. Lodder

*Corresponding author for this work

    Research output: Contribution to journalArticleAcademicpeer-review

    2 Citations (Scopus)
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    Abstract

    Polarized neutron reflectivity of a Co-Cr film on silicon with the easy axis of magnetization perpendicular to the plane has been measured at in-plane magnetic fields of various magnitudes. The obtained data can be well described assuming a constant atomic density and a gradual increase of the in-plane magnetization with depth at the different magnetic fields.
    Original languageEnglish
    Pages (from-to)695-696
    Number of pages5
    JournalJournal of magnetism and magnetic materials
    Volume140-144
    Issue number1
    DOIs
    Publication statusPublished - 1995
    EventInternational Conference on Magnetism, INTERMAG 1994 - Warsaw, Poland
    Duration: 22 Aug 199426 Aug 1994

    Fingerprint

    Magnetization
    Neutrons
    Magnetic fields
    neutrons
    magnetization
    Silicon
    magnetic fields
    reflectance
    silicon

    Keywords

    • SMI-TST: From 2006 in EWI-TST
    • SMI-MAT: MATERIALS

    Cite this

    van der Graaf, A., Fredrikze, H., de Haan, P., Rekveldt, M. T., & Lodder, J. C. (1995). Polarized neutron reflectometry on Co-Cr. Journal of magnetism and magnetic materials, 140-144(1), 695-696. https://doi.org/10.1016/0304-8853(94)00812-4
    van der Graaf, A. ; Fredrikze, H. ; de Haan, P. ; Rekveldt, M.Th. ; Lodder, J.C. / Polarized neutron reflectometry on Co-Cr. In: Journal of magnetism and magnetic materials. 1995 ; Vol. 140-144, No. 1. pp. 695-696.
    @article{64268c17188d40a9ae6931b9a494a7c4,
    title = "Polarized neutron reflectometry on Co-Cr",
    abstract = "Polarized neutron reflectivity of a Co-Cr film on silicon with the easy axis of magnetization perpendicular to the plane has been measured at in-plane magnetic fields of various magnitudes. The obtained data can be well described assuming a constant atomic density and a gradual increase of the in-plane magnetization with depth at the different magnetic fields.",
    keywords = "SMI-TST: From 2006 in EWI-TST, SMI-MAT: MATERIALS",
    author = "{van der Graaf}, A. and H. Fredrikze and {de Haan}, P. and M.Th. Rekveldt and J.C. Lodder",
    year = "1995",
    doi = "10.1016/0304-8853(94)00812-4",
    language = "English",
    volume = "140-144",
    pages = "695--696",
    journal = "Journal of magnetism and magnetic materials",
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    van der Graaf, A, Fredrikze, H, de Haan, P, Rekveldt, MT & Lodder, JC 1995, 'Polarized neutron reflectometry on Co-Cr', Journal of magnetism and magnetic materials, vol. 140-144, no. 1, pp. 695-696. https://doi.org/10.1016/0304-8853(94)00812-4

    Polarized neutron reflectometry on Co-Cr. / van der Graaf, A.; Fredrikze, H.; de Haan, P.; Rekveldt, M.Th.; Lodder, J.C.

    In: Journal of magnetism and magnetic materials, Vol. 140-144, No. 1, 1995, p. 695-696.

    Research output: Contribution to journalArticleAcademicpeer-review

    TY - JOUR

    T1 - Polarized neutron reflectometry on Co-Cr

    AU - van der Graaf, A.

    AU - Fredrikze, H.

    AU - de Haan, P.

    AU - Rekveldt, M.Th.

    AU - Lodder, J.C.

    PY - 1995

    Y1 - 1995

    N2 - Polarized neutron reflectivity of a Co-Cr film on silicon with the easy axis of magnetization perpendicular to the plane has been measured at in-plane magnetic fields of various magnitudes. The obtained data can be well described assuming a constant atomic density and a gradual increase of the in-plane magnetization with depth at the different magnetic fields.

    AB - Polarized neutron reflectivity of a Co-Cr film on silicon with the easy axis of magnetization perpendicular to the plane has been measured at in-plane magnetic fields of various magnitudes. The obtained data can be well described assuming a constant atomic density and a gradual increase of the in-plane magnetization with depth at the different magnetic fields.

    KW - SMI-TST: From 2006 in EWI-TST

    KW - SMI-MAT: MATERIALS

    U2 - 10.1016/0304-8853(94)00812-4

    DO - 10.1016/0304-8853(94)00812-4

    M3 - Article

    VL - 140-144

    SP - 695

    EP - 696

    JO - Journal of magnetism and magnetic materials

    JF - Journal of magnetism and magnetic materials

    SN - 0304-8853

    IS - 1

    ER -

    van der Graaf A, Fredrikze H, de Haan P, Rekveldt MT, Lodder JC. Polarized neutron reflectometry on Co-Cr. Journal of magnetism and magnetic materials. 1995;140-144(1):695-696. https://doi.org/10.1016/0304-8853(94)00812-4