Polarized neutron reflectometry on Co-Cr

A. van der Graaf, H. Fredrikze, P. de Haan, M.Th. Rekveldt, J.C. Lodder

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Abstract

Polarized neutron reflectivity of a Co-Cr film on silicon with the easy axis of magnetization perpendicular to the plane has been measured at in-plane magnetic fields of various magnitudes. The obtained data can be well described assuming a constant atomic density and a gradual increase of the in-plane magnetization with depth at the different magnetic fields.
Original languageEnglish
Pages (from-to)695-696
Number of pages5
JournalJournal of magnetism and magnetic materials
Volume140-144
Issue number1
DOIs
Publication statusPublished - 1995
EventInternational Conference on Magnetism, INTERMAG 1994 - Warsaw, Poland
Duration: 22 Aug 199426 Aug 1994

Fingerprint

Magnetization
Neutrons
Magnetic fields
neutrons
magnetization
Silicon
magnetic fields
reflectance
silicon

Keywords

  • SMI-TST: From 2006 in EWI-TST
  • SMI-MAT: MATERIALS

Cite this

van der Graaf, A., Fredrikze, H., de Haan, P., Rekveldt, M. T., & Lodder, J. C. (1995). Polarized neutron reflectometry on Co-Cr. Journal of magnetism and magnetic materials, 140-144(1), 695-696. https://doi.org/10.1016/0304-8853(94)00812-4
van der Graaf, A. ; Fredrikze, H. ; de Haan, P. ; Rekveldt, M.Th. ; Lodder, J.C. / Polarized neutron reflectometry on Co-Cr. In: Journal of magnetism and magnetic materials. 1995 ; Vol. 140-144, No. 1. pp. 695-696.
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abstract = "Polarized neutron reflectivity of a Co-Cr film on silicon with the easy axis of magnetization perpendicular to the plane has been measured at in-plane magnetic fields of various magnitudes. The obtained data can be well described assuming a constant atomic density and a gradual increase of the in-plane magnetization with depth at the different magnetic fields.",
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van der Graaf, A, Fredrikze, H, de Haan, P, Rekveldt, MT & Lodder, JC 1995, 'Polarized neutron reflectometry on Co-Cr' Journal of magnetism and magnetic materials, vol. 140-144, no. 1, pp. 695-696. https://doi.org/10.1016/0304-8853(94)00812-4

Polarized neutron reflectometry on Co-Cr. / van der Graaf, A.; Fredrikze, H.; de Haan, P.; Rekveldt, M.Th.; Lodder, J.C.

In: Journal of magnetism and magnetic materials, Vol. 140-144, No. 1, 1995, p. 695-696.

Research output: Contribution to journalArticleAcademicpeer-review

TY - JOUR

T1 - Polarized neutron reflectometry on Co-Cr

AU - van der Graaf, A.

AU - Fredrikze, H.

AU - de Haan, P.

AU - Rekveldt, M.Th.

AU - Lodder, J.C.

PY - 1995

Y1 - 1995

N2 - Polarized neutron reflectivity of a Co-Cr film on silicon with the easy axis of magnetization perpendicular to the plane has been measured at in-plane magnetic fields of various magnitudes. The obtained data can be well described assuming a constant atomic density and a gradual increase of the in-plane magnetization with depth at the different magnetic fields.

AB - Polarized neutron reflectivity of a Co-Cr film on silicon with the easy axis of magnetization perpendicular to the plane has been measured at in-plane magnetic fields of various magnitudes. The obtained data can be well described assuming a constant atomic density and a gradual increase of the in-plane magnetization with depth at the different magnetic fields.

KW - SMI-TST: From 2006 in EWI-TST

KW - SMI-MAT: MATERIALS

U2 - 10.1016/0304-8853(94)00812-4

DO - 10.1016/0304-8853(94)00812-4

M3 - Article

VL - 140-144

SP - 695

EP - 696

JO - Journal of magnetism and magnetic materials

JF - Journal of magnetism and magnetic materials

SN - 0304-8853

IS - 1

ER -

van der Graaf A, Fredrikze H, de Haan P, Rekveldt MT, Lodder JC. Polarized neutron reflectometry on Co-Cr. Journal of magnetism and magnetic materials. 1995;140-144(1):695-696. https://doi.org/10.1016/0304-8853(94)00812-4