Polarized neutron reflectometry on Co-Cr

A. van der Graaf; H. Fredrikze; P. de Haan; M.Th. Rekveldt; J.C. Lodder

doi:10.1016/0304-8853(94)00812-4

Polarized neutron reflectometry on Co-Cr

A. van der Graaf^*
, H. Fredrikze
, P. de Haan
, M.Th. Rekveldt
, J.C. Lodder

^*Corresponding author for this work

Research output: Contribution to journal › Article › Academic › peer-review

3 Citations (Scopus)

175 Downloads (Pure)

Abstract

Polarized neutron reflectivity of a Co-Cr film on silicon with the easy axis of magnetization perpendicular to the plane has been measured at in-plane magnetic fields of various magnitudes. The obtained data can be well described assuming a constant atomic density and a gradual increase of the in-plane magnetization with depth at the different magnetic fields.

Original language	English
Pages (from-to)	695-696
Number of pages	5
Journal	Journal of magnetism and magnetic materials
Volume	140-144
Issue number	1
DOIs	https://doi.org/10.1016/0304-8853(94)00812-4
Publication status	Published - 1995
Event	International Conference on Magnetism, INTERMAG 1994 - Warsaw, Poland Duration: 22 Aug 1994 → 26 Aug 1994

Keywords

SMI-TST: From 2006 in EWI-TST
SMI-MAT: MATERIALS

Access to Document

10.1016/0304-8853(94)00812-4

Graaf95polarizedFinal published version, 208 KB

Cite this

@article{64268c17188d40a9ae6931b9a494a7c4,

title = "Polarized neutron reflectometry on Co-Cr",

abstract = "Polarized neutron reflectivity of a Co-Cr film on silicon with the easy axis of magnetization perpendicular to the plane has been measured at in-plane magnetic fields of various magnitudes. The obtained data can be well described assuming a constant atomic density and a gradual increase of the in-plane magnetization with depth at the different magnetic fields.",

keywords = "SMI-TST: From 2006 in EWI-TST, SMI-MAT: MATERIALS",

author = "\{van der Graaf\}, A. and H. Fredrikze and \{de Haan\}, P. and M.Th. Rekveldt and J.C. Lodder",

year = "1995",

doi = "10.1016/0304-8853(94)00812-4",

language = "English",

volume = "140-144",

pages = "695--696",

journal = "Journal of magnetism and magnetic materials",

issn = "0304-8853",

publisher = "Elsevier",

number = "1",

note = "International Conference on Magnetism, INTERMAG 1994, INTERMAG ; Conference date: 22-08-1994 Through 26-08-1994",

}

TY - JOUR

T1 - Polarized neutron reflectometry on Co-Cr

AU - van der Graaf, A.

AU - Fredrikze, H.

AU - de Haan, P.

AU - Rekveldt, M.Th.

AU - Lodder, J.C.

PY - 1995

Y1 - 1995

N2 - Polarized neutron reflectivity of a Co-Cr film on silicon with the easy axis of magnetization perpendicular to the plane has been measured at in-plane magnetic fields of various magnitudes. The obtained data can be well described assuming a constant atomic density and a gradual increase of the in-plane magnetization with depth at the different magnetic fields.

AB - Polarized neutron reflectivity of a Co-Cr film on silicon with the easy axis of magnetization perpendicular to the plane has been measured at in-plane magnetic fields of various magnitudes. The obtained data can be well described assuming a constant atomic density and a gradual increase of the in-plane magnetization with depth at the different magnetic fields.

KW - SMI-TST: From 2006 in EWI-TST

KW - SMI-MAT: MATERIALS

U2 - 10.1016/0304-8853(94)00812-4

DO - 10.1016/0304-8853(94)00812-4

M3 - Article

SN - 0304-8853

VL - 140-144

SP - 695

EP - 696

JO - Journal of magnetism and magnetic materials

JF - Journal of magnetism and magnetic materials

IS - 1

T2 - International Conference on Magnetism, INTERMAG 1994

Y2 - 22 August 1994 through 26 August 1994

ER -

Polarized neutron reflectometry on Co-Cr

Abstract

Keywords

Access to Document

Fingerprint

Cite this