Policies for Probe-Wear Leveling in MEMS-Based Storage Devices

M.G. Khatib; Pieter H. Hartel

doi:10.1109/MASCOT.2009.5366652

Policies for Probe-Wear Leveling in MEMS-Based Storage Devices

M.G. Khatib, Pieter H. Hartel

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

1 Citation (Scopus)

173 Downloads (Pure)

Abstract

Probes (or read/write heads) in MEMS-based storage devices are susceptible to wear. We study probe wear, and analyze the causes of probe uneven wear. We show that under real-world traces some probes can wear one order of magnitude faster than other probes leading to premature expiry of some probes. Premature expiry has severe consequences for the reliability, timing performance, energy-efficiency, and the lifetime of MEMS-based storage devices. Therefore, wear-leveling is a must to preclude premature expiry. We discuss how probe wear in MEMS-based storage is different from medium wear in Flash, calling for a different treatment. We present three policies to level probe wear. By simulation against three real-world traces, our work shows that an inevitable trade-off exists between lifetime, timing performance, and energy efficiency. The policies differ in the size of the trade-off. One of the policies maximizes the lifetime, so that it is optimal; and the other two are less optimal, and are used based on the configuration of the device.

Original language	Undefined
Title of host publication	Proceedings of the 17th Annual Meeting of the IEEE/ACM International Symposium on Modeling, Analysis & Simulation of Computer and Telecommunication Systems (MASCOTS)
Place of Publication	Piscataway
Publisher	IEEE
Pages	152-161
Number of pages	10
ISBN (Print)	978-1-4244-4928-6
DOIs	https://doi.org/10.1109/MASCOT.2009.5366652
Publication status	Published - 19 Sept 2009
Event	2009 IEEE Symposium on Modeling, Analysis and Simulation of Copmputer and Telecommunication Systems, MASCOTS 2009 - London, United Kingdom Duration: 21 Sept 2009 → 23 Sept 2009 Conference number: 17 http://mascots2009.doc.ic.ac.uk/

Publication series

Name
Publisher	IEEE Computer Society Press
ISSN (Print)	1526-7539

Conference

Conference	2009 IEEE Symposium on Modeling, Analysis and Simulation of Copmputer and Telecommunication Systems, MASCOTS 2009
Abbreviated title	MASCOTS
Country/Territory	United Kingdom
City	London
Period	21/09/09 → 23/09/09
Internet address	http://mascots2009.doc.ic.ac.uk/

Keywords

METIS-264037
IR-68052
Wear leveling
EWI-16090
Probe Storage
Probe wear
MEMS-Based Storage

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

Access to Document

10.1109/MASCOT.2009.5366652

Cite this

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title = "Policies for Probe-Wear Leveling in MEMS-Based Storage Devices",

abstract = "Probes (or read/write heads) in MEMS-based storage devices are susceptible to wear. We study probe wear, and analyze the causes of probe uneven wear. We show that under real-world traces some probes can wear one order of magnitude faster than other probes leading to premature expiry of some probes. Premature expiry has severe consequences for the reliability, timing performance, energy-efficiency, and the lifetime of MEMS-based storage devices. Therefore, wear-leveling is a must to preclude premature expiry. We discuss how probe wear in MEMS-based storage is different from medium wear in Flash, calling for a different treatment. We present three policies to level probe wear. By simulation against three real-world traces, our work shows that an inevitable trade-off exists between lifetime, timing performance, and energy efficiency. The policies differ in the size of the trade-off. One of the policies maximizes the lifetime, so that it is optimal; and the other two are less optimal, and are used based on the configuration of the device.",

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Khatib, MG & Hartel, PH 2009, Policies for Probe-Wear Leveling in MEMS-Based Storage Devices. in Proceedings of the 17th Annual Meeting of the IEEE/ACM International Symposium on Modeling, Analysis & Simulation of Computer and Telecommunication Systems (MASCOTS). IEEE, Piscataway, pp. 152-161, 2009 IEEE Symposium on Modeling, Analysis and Simulation of Copmputer and Telecommunication Systems, MASCOTS 2009, London, United Kingdom, 21/09/09. https://doi.org/10.1109/MASCOT.2009.5366652

Policies for Probe-Wear Leveling in MEMS-Based Storage Devices. / Khatib, M.G.; Hartel, Pieter H.
Proceedings of the 17th Annual Meeting of the IEEE/ACM International Symposium on Modeling, Analysis & Simulation of Computer and Telecommunication Systems (MASCOTS). Piscataway: IEEE, 2009. p. 152-161.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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N2 - Probes (or read/write heads) in MEMS-based storage devices are susceptible to wear. We study probe wear, and analyze the causes of probe uneven wear. We show that under real-world traces some probes can wear one order of magnitude faster than other probes leading to premature expiry of some probes. Premature expiry has severe consequences for the reliability, timing performance, energy-efficiency, and the lifetime of MEMS-based storage devices. Therefore, wear-leveling is a must to preclude premature expiry. We discuss how probe wear in MEMS-based storage is different from medium wear in Flash, calling for a different treatment. We present three policies to level probe wear. By simulation against three real-world traces, our work shows that an inevitable trade-off exists between lifetime, timing performance, and energy efficiency. The policies differ in the size of the trade-off. One of the policies maximizes the lifetime, so that it is optimal; and the other two are less optimal, and are used based on the configuration of the device.

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