Position sensitive detector bandwidth dependence on wavelength, power and bias

Bart van Rooijen, J.H.G. Huisstede, Kees van der Werf, Martin L. Bennink, Vinod Subramaniam

    Research output: Contribution to conferencePosterOther research output

    Original languageUndefined
    Pages-
    Publication statusPublished - 4 Nov 2005
    EventDutch Scanning Probe Microscopy Day 2005 - Technical University of Eindhoven, Eindhoven, Netherlands
    Duration: 4 Nov 20054 Nov 2005
    Conference number: 13

    Conference

    ConferenceDutch Scanning Probe Microscopy Day 2005
    Abbreviated titleDutch SPM Day 2005
    CountryNetherlands
    CityEindhoven
    Period4/11/054/11/05

    Keywords

    • METIS-229569

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