Position sensitive detector bandwidth dependence on wavelength, power and bias

Bart van Rooijen, J.H.G. Huisstede, Kees van der Werf, Martin L. Bennink, Vinod Subramaniam

Research output: Contribution to conference › Poster › Other research output

Original language	Undefined
Pages	-
Publication status	Published - 4 Nov 2005
Event	Dutch Scanning Probe Microscopy Day 2005 - Technical University of Eindhoven, Eindhoven, Netherlands Duration: 4 Nov 2005 → 4 Nov 2005 Conference number: 13

Conference	Dutch Scanning Probe Microscopy Day 2005
Abbreviated title	Dutch SPM Day 2005
Country/Territory	Netherlands
City	Eindhoven
Period	4/11/05 → 4/11/05

Keywords

@conference{f6d54dff55b042dba701b0cda8bd5c09,

title = "Position sensitive detector bandwidth dependence on wavelength, power and bias",

keywords = "METIS-229569",

author = "\{van Rooijen\}, Bart and J.H.G. Huisstede and \{van der Werf\}, Kees and Bennink, \{Martin L.\} and Vinod Subramaniam",

year = "2005",

month = nov,

day = "4",

language = "Undefined",

pages = "--",

note = "Dutch Scanning Probe Microscopy Day 2005 ; Conference date: 04-11-2005 Through 04-11-2005",

}

TY - CONF

T1 - Position sensitive detector bandwidth dependence on wavelength, power and bias

AU - van Rooijen, Bart

AU - Huisstede, J.H.G.

AU - van der Werf, Kees

AU - Bennink, Martin L.

AU - Subramaniam, Vinod

N1 - Conference code: 13

PY - 2005/11/4

Y1 - 2005/11/4

KW - METIS-229569

M3 - Poster

SP - -

T2 - Dutch Scanning Probe Microscopy Day 2005

Y2 - 4 November 2005 through 4 November 2005

ER -