Power-dissipation comparison of two dependability approaches for multi-processor systems

Yong Zhao; Xiao Zhang; Hans G. Kerkhoff

doi:10.1109/DTIS.2013.6527778

Power-dissipation comparison of two dependability approaches for multi-processor systems

Yong Zhao, Xiao Zhang, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic

2 Citations (Scopus)

32 Downloads (Pure)

Abstract

The additional power dissipation involved in introducing a high dependability in multi-processor systems is nowadays becoming a major concern (power-aware dependability). In this paper, the power dissipation components of a recently implemented scan-test based dependability testing approach for a multi-processor Systems-on-Chip (SoC) is evaluated. It is shown that the application of scan-test vectors to the cores is the major power contributor. To avoid this dissipation and hence scan test, a new prognostic approach for life-time prediction using on-line health monitors is proposed accomplishing the same high dependability. It will be shown that the latter approach consumes less power under the same dependability specifications. Actual measurements and theoretical calculations are provided as well as a suggestion for future dependable systems given.

Original language	English
Title of host publication	8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)
Editors	Yong Zhao
Place of Publication	Piscataway, NJ
Publisher	IEEE
Pages	56-61
Number of pages	6
ISBN (Electronic)	978-1-4673-6040-1, 978-1-4673-6038-8
ISBN (Print)	978-1-4673-6039-5
DOIs	https://doi.org/10.1109/DTIS.2013.6527778
Publication status	Published - 26 Mar 2013
Event	8th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2013 - Abu Dhabi, United Arab Emirates Duration: 26 Mar 2013 → 28 Mar 2013 Conference number: 8

Conference

Conference	8th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2013
Abbreviated title	DTIS
Country/Territory	United Arab Emirates
City	Abu Dhabi
Period	26/03/13 → 28/03/13

Keywords

on-line health-monitoring
dependability testing
power-aware dependability
MP-SoC systems
prognostics

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10.1109/DTIS.2013.6527778

Cite this

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title = "Power-dissipation comparison of two dependability approaches for multi-processor systems",

abstract = "The additional power dissipation involved in introducing a high dependability in multi-processor systems is nowadays becoming a major concern (power-aware dependability). In this paper, the power dissipation components of a recently implemented scan-test based dependability testing approach for a multi-processor Systems-on-Chip (SoC) is evaluated. It is shown that the application of scan-test vectors to the cores is the major power contributor. To avoid this dissipation and hence scan test, a new prognostic approach for life-time prediction using on-line health monitors is proposed accomplishing the same high dependability. It will be shown that the latter approach consumes less power under the same dependability specifications. Actual measurements and theoretical calculations are provided as well as a suggestion for future dependable systems given.",

keywords = "on-line health-monitoring, dependability testing, power-aware dependability, MP-SoC systems, prognostics",

author = "Yong Zhao and Xiao Zhang and Kerkhoff, {Hans G.}",

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doi = "10.1109/DTIS.2013.6527778",

language = "English",

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pages = "56--61",

editor = "Yong Zhao",

booktitle = "8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)",

publisher = "IEEE",

address = "United States",

note = "8th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2013, DTIS ; Conference date: 26-03-2013 Through 28-03-2013",

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Zhao, Y, Zhang, X & Kerkhoff, HG 2013, Power-dissipation comparison of two dependability approaches for multi-processor systems. in Y Zhao (ed.), 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS). IEEE, Piscataway, NJ, pp. 56-61, 8th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2013, Abu Dhabi, United Arab Emirates, 26/03/13. https://doi.org/10.1109/DTIS.2013.6527778

Power-dissipation comparison of two dependability approaches for multi-processor systems. / Zhao, Yong; Zhang, Xiao; Kerkhoff, Hans G.
8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS). ed. / Yong Zhao. Piscataway, NJ: IEEE, 2013. p. 56-61.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic

TY - GEN

T1 - Power-dissipation comparison of two dependability approaches for multi-processor systems

AU - Zhao, Yong

AU - Zhang, Xiao

AU - Kerkhoff, Hans G.

N1 - Conference code: 8

PY - 2013/3/26

Y1 - 2013/3/26

N2 - The additional power dissipation involved in introducing a high dependability in multi-processor systems is nowadays becoming a major concern (power-aware dependability). In this paper, the power dissipation components of a recently implemented scan-test based dependability testing approach for a multi-processor Systems-on-Chip (SoC) is evaluated. It is shown that the application of scan-test vectors to the cores is the major power contributor. To avoid this dissipation and hence scan test, a new prognostic approach for life-time prediction using on-line health monitors is proposed accomplishing the same high dependability. It will be shown that the latter approach consumes less power under the same dependability specifications. Actual measurements and theoretical calculations are provided as well as a suggestion for future dependable systems given.

AB - The additional power dissipation involved in introducing a high dependability in multi-processor systems is nowadays becoming a major concern (power-aware dependability). In this paper, the power dissipation components of a recently implemented scan-test based dependability testing approach for a multi-processor Systems-on-Chip (SoC) is evaluated. It is shown that the application of scan-test vectors to the cores is the major power contributor. To avoid this dissipation and hence scan test, a new prognostic approach for life-time prediction using on-line health monitors is proposed accomplishing the same high dependability. It will be shown that the latter approach consumes less power under the same dependability specifications. Actual measurements and theoretical calculations are provided as well as a suggestion for future dependable systems given.

KW - on-line health-monitoring

KW - dependability testing

KW - power-aware dependability

KW - MP-SoC systems

KW - prognostics

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DO - 10.1109/DTIS.2013.6527778

M3 - Conference contribution

SN - 978-1-4673-6039-5

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EP - 61

BT - 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)

A2 - Zhao, Yong

PB - IEEE

CY - Piscataway, NJ

T2 - 8th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2013

Y2 - 26 March 2013 through 28 March 2013

ER -

Power-dissipation comparison of two dependability approaches for multi-processor systems

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Keywords

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