Practical Implementation of Defect-Oriented Testing for a Mixed-Signal Class-D Amplifier

R.H. Beurze, Y. Xing, R. van Kleef, R.J.W.T. Tangelder, N. Engin

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    9 Citations (Scopus)
    215 Downloads (Pure)

    Abstract

    This paper describes the flow of defect-oriented testing from beginning to end, based on the industrial test development for a commercial mixed-signal class-D amplifier. A software tool called DOTSS (Defect-Oriented Test Simulation System) was used to perform the fault simulations. The greatest benefit of using defect-oriented testing turns out to be that it gives more insight in the underlying fault mechanisms. This information can be used to generate complementary tests or to take design-for-testability measures to achieve a high fault coverage
    Original languageEnglish
    Title of host publicationIEEE European Test Workshop 1999
    Place of PublicationPiscataway, NJ
    PublisherIEEE
    Pages28-33
    Number of pages6
    ISBN (Print)0-7695-0391-8
    DOIs
    Publication statusPublished - 1 May 1999
    EventIEEE European Test Workshop, 1999 - Constance, Germany
    Duration: 25 May 199928 May 1999

    Conference

    ConferenceIEEE European Test Workshop, 1999
    Period25/05/9928/05/99
    Other25-28 May 1999

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