Practical Implementation of Defect-Oriented Testing for a Mixed-Signal Class-D Amplifier

R.H. Beurze; Y Xing; Y. Xing; R. van Kleef; R.J.W.T. Tangelder; N. Engin

doi:10.1109/ETW.1999.804205

Practical Implementation of Defect-Oriented Testing for a Mixed-Signal Class-D Amplifier

R.H. Beurze, Y Xing, Y. Xing, R. van Kleef, R.J.W.T. Tangelder, N. Engin

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

9 Citations (Scopus)

146 Downloads (Pure)

Abstract

This paper describes the flow of defect-oriented testing from beginning to end, based on the industrial test development for a commercial mixed-signal class-D amplifier. A software tool called DOTSS (Defect-Oriented Test Simulation System) was used to perform the fault simulations. The greatest benefit of using defect-oriented testing turns out to be that it gives more insight in the underlying fault mechanisms. This information can be used to generate complementary tests or to take design-for-testability measures to achieve a high fault coverage

Original language	Undefined
Title of host publication	IEEE European Test Workshop
Place of Publication	Constance, Germany
Publisher	IEEE
Pages	28-33
Number of pages	6
ISBN (Print)	0-7695-0391-8
DOIs	https://doi.org/10.1109/ETW.1999.804205
Publication status	Published - 1 May 1999
Event	IEEE European Test Workshop, 1999 - Constance, Germany Duration: 25 May 1999 → 28 May 1999

Publication series

Name
Publisher	IEEE

Conference

Conference	IEEE European Test Workshop, 1999
Period	25/05/99 → 28/05/99
Other	25-28 May 1999

Keywords

IR-16157
METIS-113042

Access to Document

10.1109/ETW.1999.804205

00804205

Cite this

@inproceedings{3973f746fa094967935088dc71802cb0,

title = "Practical Implementation of Defect-Oriented Testing for a Mixed-Signal Class-D Amplifier",

abstract = "This paper describes the flow of defect-oriented testing from beginning to end, based on the industrial test development for a commercial mixed-signal class-D amplifier. A software tool called DOTSS (Defect-Oriented Test Simulation System) was used to perform the fault simulations. The greatest benefit of using defect-oriented testing turns out to be that it gives more insight in the underlying fault mechanisms. This information can be used to generate complementary tests or to take design-for-testability measures to achieve a high fault coverage",

keywords = "IR-16157, METIS-113042",

author = "R.H. Beurze and Y Xing and Y. Xing and {van Kleef}, R. and R.J.W.T. Tangelder and N. Engin",

year = "1999",

month = may,

day = "1",

doi = "10.1109/ETW.1999.804205",

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isbn = "0-7695-0391-8",

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AU - Beurze, R.H.

AU - Xing, Y

AU - Xing, Y.

AU - van Kleef, R.

AU - Tangelder, R.J.W.T.

AU - Engin, N.

PY - 1999/5/1

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N2 - This paper describes the flow of defect-oriented testing from beginning to end, based on the industrial test development for a commercial mixed-signal class-D amplifier. A software tool called DOTSS (Defect-Oriented Test Simulation System) was used to perform the fault simulations. The greatest benefit of using defect-oriented testing turns out to be that it gives more insight in the underlying fault mechanisms. This information can be used to generate complementary tests or to take design-for-testability measures to achieve a high fault coverage

AB - This paper describes the flow of defect-oriented testing from beginning to end, based on the industrial test development for a commercial mixed-signal class-D amplifier. A software tool called DOTSS (Defect-Oriented Test Simulation System) was used to perform the fault simulations. The greatest benefit of using defect-oriented testing turns out to be that it gives more insight in the underlying fault mechanisms. This information can be used to generate complementary tests or to take design-for-testability measures to achieve a high fault coverage

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KW - METIS-113042

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EP - 33

BT - IEEE European Test Workshop

PB - IEEE

CY - Constance, Germany

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