Abstract
This paper describes the flow of defect-oriented testing from beginning to end, based on the industrial test development for a commercial mixed-signal class-D amplifier. A software tool called DOTSS (Defect-Oriented Test Simulation System) was used to perform the fault simulations. The greatest benefit of using defect-oriented testing turns out to be that it gives more insight in the underlying fault mechanisms. This information can be used to generate complementary tests or to take design-for-testability measures to achieve a high fault coverage
Original language | English |
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Title of host publication | IEEE European Test Workshop 1999 |
Place of Publication | Piscataway, NJ |
Publisher | IEEE |
Pages | 28-33 |
Number of pages | 6 |
ISBN (Print) | 0-7695-0391-8 |
DOIs | |
Publication status | Published - 1 May 1999 |
Event | IEEE European Test Workshop, 1999 - Constance, Germany Duration: 25 May 1999 → 28 May 1999 |
Conference
Conference | IEEE European Test Workshop, 1999 |
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Period | 25/05/99 → 28/05/99 |
Other | 25-28 May 1999 |