Practical Implementation of Defect-Oriented Testing for a Mixed-Signal Class-D Amplifier

R.H. Beurze, Y Xing, Y. Xing, R. van Kleef, R.J.W.T. Tangelder, N. Engin

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    This paper describes the flow of defect-oriented testing from beginning to end, based on the industrial test development for a commercial mixed-signal class-D amplifier. A software tool called DOTSS (Defect-Oriented Test Simulation System) was used to perform the fault simulations. The greatest benefit of using defect-oriented testing turns out to be that it gives more insight in the underlying fault mechanisms. This information can be used to generate complementary tests or to take design-for-testability measures to achieve a high fault coverage
    Original languageUndefined
    Title of host publicationIEEE European Test Workshop
    Place of PublicationConstance, Germany
    Number of pages6
    ISBN (Print)0-7695-0391-8
    Publication statusPublished - 1 May 1999

    Publication series



    • IR-16157
    • METIS-113042

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