Practical Implementation of Defect-Oriented Testing for a Mixed-Signal Class-D Amplifier

R.H. Beurze; Y. Xing; R. van Kleef; R.J.W.T. Tangelder; N. Engin

doi:10.1109/ETW.1999.804205

Practical Implementation of Defect-Oriented Testing for a Mixed-Signal Class-D Amplifier

R.H. Beurze
, Y. Xing
, R. van Kleef
, R.J.W.T. Tangelder
, N. Engin

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

9 Citations (Scopus)

289 Downloads (Pure)

Abstract

This paper describes the flow of defect-oriented testing from beginning to end, based on the industrial test development for a commercial mixed-signal class-D amplifier. A software tool called DOTSS (Defect-Oriented Test Simulation System) was used to perform the fault simulations. The greatest benefit of using defect-oriented testing turns out to be that it gives more insight in the underlying fault mechanisms. This information can be used to generate complementary tests or to take design-for-testability measures to achieve a high fault coverage

Original language	English
Title of host publication	IEEE European Test Workshop 1999
Place of Publication	Piscataway, NJ
Publisher	IEEE
Pages	28-33
Number of pages	6
ISBN (Print)	0-7695-0391-8
DOIs	https://doi.org/10.1109/ETW.1999.804205
Publication status	Published - 1 May 1999
Event	IEEE European Test Workshop, 1999 - Constance, Germany Duration: 25 May 1999 → 28 May 1999

Conference

Conference	IEEE European Test Workshop, 1999
Period	25/05/99 → 28/05/99
Other	25-28 May 1999

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@inproceedings{3973f746fa094967935088dc71802cb0,

title = "Practical Implementation of Defect-Oriented Testing for a Mixed-Signal Class-D Amplifier",

abstract = "This paper describes the flow of defect-oriented testing from beginning to end, based on the industrial test development for a commercial mixed-signal class-D amplifier. A software tool called DOTSS (Defect-Oriented Test Simulation System) was used to perform the fault simulations. The greatest benefit of using defect-oriented testing turns out to be that it gives more insight in the underlying fault mechanisms. This information can be used to generate complementary tests or to take design-for-testability measures to achieve a high fault coverage",

author = "R.H. Beurze and Y. Xing and \{van Kleef\}, R. and R.J.W.T. Tangelder and N. Engin",

year = "1999",

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AU - Engin, N.

PY - 1999/5/1

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N2 - This paper describes the flow of defect-oriented testing from beginning to end, based on the industrial test development for a commercial mixed-signal class-D amplifier. A software tool called DOTSS (Defect-Oriented Test Simulation System) was used to perform the fault simulations. The greatest benefit of using defect-oriented testing turns out to be that it gives more insight in the underlying fault mechanisms. This information can be used to generate complementary tests or to take design-for-testability measures to achieve a high fault coverage

AB - This paper describes the flow of defect-oriented testing from beginning to end, based on the industrial test development for a commercial mixed-signal class-D amplifier. A software tool called DOTSS (Defect-Oriented Test Simulation System) was used to perform the fault simulations. The greatest benefit of using defect-oriented testing turns out to be that it gives more insight in the underlying fault mechanisms. This information can be used to generate complementary tests or to take design-for-testability measures to achieve a high fault coverage

U2 - 10.1109/ETW.1999.804205

DO - 10.1109/ETW.1999.804205

M3 - Conference contribution

SN - 0-7695-0391-8

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EP - 33

BT - IEEE European Test Workshop 1999

PB - IEEE

CY - Piscataway, NJ

T2 - IEEE European Test Workshop, 1999

Y2 - 25 May 1999 through 28 May 1999

ER -

Practical Implementation of Defect-Oriented Testing for a Mixed-Signal Class-D Amplifier

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