Practical Implementation of Defect-Oriented Testing for a Mixed-Signal Class-D Amplifier

R.H. Beurze, Y. Xing, R. van Kleef, R.J.W.T. Tangelder, N. Engin

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    9 Citations (Scopus)
    219 Downloads (Pure)

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