Predicting aging caused delay degradation with alternative IDDT testing in a VLIW processor

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    Abstract

    In this paper, delay and transient power-supply current (IDDT) testing has been applied for a 90nm VLIW DSP IP core, to demonstrate the IDDT testing an effective alternative of delay testing to detect aging degradation. The test environment for validation, implementing an accelerated test (AT) has been investigated, delay and IDDT measurement data resulting from AT is presented and analysed. It is found that both delay and IDDT testing results for the processor characterize the power law degradation with the aging trend, which is in coherence with behaviour of the NBTI aging mechanism. Analysis shows their coefficient is of strong correlation.
    Original languageUndefined
    Title of host publicationProceedings of the final Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale, MEDIAN 2015
    EditorsYong Zhao
    Place of PublicationBrussels
    PublisherEuropean Cooperation in Science and Technology
    Pages27-32
    Number of pages6
    ISBN (Print)not assigned
    Publication statusPublished - Nov 2015

    Publication series

    Name
    PublisherEuropean Cooperation in Science and Technology

    Keywords

    • delay testing
    • reliability testing
    • EWI-26456
    • alternative testing
    • functional testing
    • METIS-315031
    • Aging
    • DSP processor
    • IDDT testing
    • NBTI
    • IR-98255

    Cite this

    Kerkhoff, H. G. (2015). Predicting aging caused delay degradation with alternative IDDT testing in a VLIW processor. In Y. Zhao (Ed.), Proceedings of the final Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale, MEDIAN 2015 (pp. 27-32). Brussels: European Cooperation in Science and Technology.