Predicting aging caused delay degradation with alternative IDDT testing in a VLIW processor

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Abstract

    In this paper, delay and transient power-supply current (IDDT) testing has been applied for a 90nm VLIW DSP IP core, to demonstrate the IDDT testing an effective alternative of delay testing to detect aging degradation. The test environment for validation, implementing an accelerated test (AT) has been investigated, delay and IDDT measurement data resulting from AT is presented and analysed. It is found that both delay and IDDT testing results for the processor characterize the power law degradation with the aging trend, which is in coherence with behaviour of the NBTI aging mechanism. Analysis shows their coefficient is of strong correlation.
    Original languageUndefined
    Title of host publicationProceedings of the final Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale, MEDIAN 2015
    EditorsYong Zhao
    Place of PublicationBrussels
    PublisherEuropean Cooperation in Science and Technology
    Pages27-32
    Number of pages6
    ISBN (Print)not assigned
    Publication statusPublished - Nov 2015

    Publication series

    Name
    PublisherEuropean Cooperation in Science and Technology

    Keywords

    • delay testing
    • reliability testing
    • EWI-26456
    • alternative testing
    • functional testing
    • METIS-315031
    • Aging
    • DSP processor
    • IDDT testing
    • NBTI
    • IR-98255

    Cite this

    Kerkhoff, H. G. (2015). Predicting aging caused delay degradation with alternative IDDT testing in a VLIW processor. In Y. Zhao (Ed.), Proceedings of the final Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale, MEDIAN 2015 (pp. 27-32). Brussels: European Cooperation in Science and Technology.
    Kerkhoff, Hans G. / Predicting aging caused delay degradation with alternative IDDT testing in a VLIW processor. Proceedings of the final Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale, MEDIAN 2015. editor / Yong Zhao. Brussels : European Cooperation in Science and Technology, 2015. pp. 27-32
    @inproceedings{0015564693e3468aa80bbee46b20a85d,
    title = "Predicting aging caused delay degradation with alternative IDDT testing in a VLIW processor",
    abstract = "In this paper, delay and transient power-supply current (IDDT) testing has been applied for a 90nm VLIW DSP IP core, to demonstrate the IDDT testing an effective alternative of delay testing to detect aging degradation. The test environment for validation, implementing an accelerated test (AT) has been investigated, delay and IDDT measurement data resulting from AT is presented and analysed. It is found that both delay and IDDT testing results for the processor characterize the power law degradation with the aging trend, which is in coherence with behaviour of the NBTI aging mechanism. Analysis shows their coefficient is of strong correlation.",
    keywords = "delay testing, reliability testing, EWI-26456, alternative testing, functional testing, METIS-315031, Aging, DSP processor, IDDT testing, NBTI, IR-98255",
    author = "Kerkhoff, {Hans G.}",
    note = "AK: 1) In principle, Official URL should not be a link to a PDF file itself. It should be a link to some page where your contribution is visible and can be downloaded from. Are there such options? 2) Do you have a confirmation that this work is refereed? Normally such workshop contributions, related to EU projects, are not refereed. ZY: 1)Right now I can only find the URL like mentioned, and it can be seen and downloaded. 2)Here I forward my paper reviewing below. It is contribution to a workshop but with a 20 - 30 percent acceptation rate.",
    year = "2015",
    month = "11",
    language = "Undefined",
    isbn = "not assigned",
    publisher = "European Cooperation in Science and Technology",
    pages = "27--32",
    editor = "Yong Zhao",
    booktitle = "Proceedings of the final Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale, MEDIAN 2015",

    }

    Kerkhoff, HG 2015, Predicting aging caused delay degradation with alternative IDDT testing in a VLIW processor. in Y Zhao (ed.), Proceedings of the final Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale, MEDIAN 2015. European Cooperation in Science and Technology, Brussels, pp. 27-32.

    Predicting aging caused delay degradation with alternative IDDT testing in a VLIW processor. / Kerkhoff, Hans G.

    Proceedings of the final Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale, MEDIAN 2015. ed. / Yong Zhao. Brussels : European Cooperation in Science and Technology, 2015. p. 27-32.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    TY - GEN

    T1 - Predicting aging caused delay degradation with alternative IDDT testing in a VLIW processor

    AU - Kerkhoff, Hans G.

    N1 - AK: 1) In principle, Official URL should not be a link to a PDF file itself. It should be a link to some page where your contribution is visible and can be downloaded from. Are there such options? 2) Do you have a confirmation that this work is refereed? Normally such workshop contributions, related to EU projects, are not refereed. ZY: 1)Right now I can only find the URL like mentioned, and it can be seen and downloaded. 2)Here I forward my paper reviewing below. It is contribution to a workshop but with a 20 - 30 percent acceptation rate.

    PY - 2015/11

    Y1 - 2015/11

    N2 - In this paper, delay and transient power-supply current (IDDT) testing has been applied for a 90nm VLIW DSP IP core, to demonstrate the IDDT testing an effective alternative of delay testing to detect aging degradation. The test environment for validation, implementing an accelerated test (AT) has been investigated, delay and IDDT measurement data resulting from AT is presented and analysed. It is found that both delay and IDDT testing results for the processor characterize the power law degradation with the aging trend, which is in coherence with behaviour of the NBTI aging mechanism. Analysis shows their coefficient is of strong correlation.

    AB - In this paper, delay and transient power-supply current (IDDT) testing has been applied for a 90nm VLIW DSP IP core, to demonstrate the IDDT testing an effective alternative of delay testing to detect aging degradation. The test environment for validation, implementing an accelerated test (AT) has been investigated, delay and IDDT measurement data resulting from AT is presented and analysed. It is found that both delay and IDDT testing results for the processor characterize the power law degradation with the aging trend, which is in coherence with behaviour of the NBTI aging mechanism. Analysis shows their coefficient is of strong correlation.

    KW - delay testing

    KW - reliability testing

    KW - EWI-26456

    KW - alternative testing

    KW - functional testing

    KW - METIS-315031

    KW - Aging

    KW - DSP processor

    KW - IDDT testing

    KW - NBTI

    KW - IR-98255

    M3 - Conference contribution

    SN - not assigned

    SP - 27

    EP - 32

    BT - Proceedings of the final Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale, MEDIAN 2015

    A2 - Zhao, Yong

    PB - European Cooperation in Science and Technology

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    Kerkhoff HG. Predicting aging caused delay degradation with alternative IDDT testing in a VLIW processor. In Zhao Y, editor, Proceedings of the final Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale, MEDIAN 2015. Brussels: European Cooperation in Science and Technology. 2015. p. 27-32