Predicting aging caused delay degradation with alternative IDDT testing in a VLIW processor

Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Fingerprint

    Dive into the research topics of 'Predicting aging caused delay degradation with alternative IDDT testing in a VLIW processor'. Together they form a unique fingerprint.