PRESS - A Circuit Simulator with Built-In Reliability Model for Hot-Carrier Degradation

M.M. Lunenborg, P.B.M. Wolbert, P.B.L. Meijer, T.P. Nguyen, J.F. Verweij

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings 6th International Conference Quality in Electronic Components Failure Prevention, Detection and Analysis, ESREF '93
    Place of PublicationBordeaux, Arcachon, France
    Pages157-161
    Publication statusPublished - 4 Oct 1993

    Keywords

    • METIS-113992

    Cite this

    Lunenborg, M. M., Wolbert, P. B. M., Meijer, P. B. L., Nguyen, T. P., & Verweij, J. F. (1993). PRESS - A Circuit Simulator with Built-In Reliability Model for Hot-Carrier Degradation. In Proceedings 6th International Conference Quality in Electronic Components Failure Prevention, Detection and Analysis, ESREF '93 (pp. 157-161). Bordeaux, Arcachon, France.