PRESS - A Circuit Simulator with Built-In Reliability Model for Hot-Carrier Degradation

M.M. Lunenborg, P.B.M. Wolbert, P.B.L. Meijer, T.P. Nguyen, J.F. Verweij

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings 6th International Conference Quality in Electronic Components Failure Prevention, Detection and Analysis, ESREF '93
Place of Publication	Bordeaux, Arcachon, France
Pages	157-161
Publication status	Published - 4 Oct 1993

Keywords

@inproceedings{26657b8085d340ab8a1f4dfd6e308fda,

title = "PRESS - A Circuit Simulator with Built-In Reliability Model for Hot-Carrier Degradation",

keywords = "METIS-113992",

author = "M.M. Lunenborg and P.B.M. Wolbert and P.B.L. Meijer and T.P. Nguyen and J.F. Verweij",

year = "1993",

month = oct,

day = "4",

language = "Undefined",

pages = "157--161",

booktitle = "Proceedings 6th International Conference Quality in Electronic Components Failure Prevention, Detection and Analysis, ESREF '93",

}

PRESS - A Circuit Simulator with Built-In Reliability Model for Hot-Carrier Degradation. / Lunenborg, M.M.; Wolbert, P.B.M.; Meijer, P.B.L. et al.
Proceedings 6th International Conference Quality in Electronic Components Failure Prevention, Detection and Analysis, ESREF '93. Bordeaux, Arcachon, France, 1993. p. 157-161.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - PRESS - A Circuit Simulator with Built-In Reliability Model for Hot-Carrier Degradation

AU - Lunenborg, M.M.

AU - Wolbert, P.B.M.

AU - Meijer, P.B.L.

AU - Nguyen, T.P.

AU - Verweij, J.F.

PY - 1993/10/4

Y1 - 1993/10/4

KW - METIS-113992

M3 - Conference contribution

SP - 157

EP - 161

BT - Proceedings 6th International Conference Quality in Electronic Components Failure Prevention, Detection and Analysis, ESREF '93

CY - Bordeaux, Arcachon, France

ER -