PRESS - A Circuit Simulator with Built-In Reliability Model for Hot-Carrier Degradation

M.M. Lunenborg, P.B.M. Wolbert, P.B.L. Meijer, T.P. Nguyen, J.F. Verweij

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageUndefined
Title of host publicationProceedings 6th International Conference Quality in Electronic Components Failure Prevention, Detection and Analysis, ESREF '93
Place of PublicationBordeaux, Arcachon, France
Pages157-161
Publication statusPublished - 4 Oct 1993

Keywords

  • METIS-113992

Cite this

Lunenborg, M. M., Wolbert, P. B. M., Meijer, P. B. L., Nguyen, T. P., & Verweij, J. F. (1993). PRESS - A Circuit Simulator with Built-In Reliability Model for Hot-Carrier Degradation. In Proceedings 6th International Conference Quality in Electronic Components Failure Prevention, Detection and Analysis, ESREF '93 (pp. 157-161). Bordeaux, Arcachon, France.
Lunenborg, M.M. ; Wolbert, P.B.M. ; Meijer, P.B.L. ; Nguyen, T.P. ; Verweij, J.F. / PRESS - A Circuit Simulator with Built-In Reliability Model for Hot-Carrier Degradation. Proceedings 6th International Conference Quality in Electronic Components Failure Prevention, Detection and Analysis, ESREF '93. Bordeaux, Arcachon, France, 1993. pp. 157-161
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title = "PRESS - A Circuit Simulator with Built-In Reliability Model for Hot-Carrier Degradation",
keywords = "METIS-113992",
author = "M.M. Lunenborg and P.B.M. Wolbert and P.B.L. Meijer and T.P. Nguyen and J.F. Verweij",
year = "1993",
month = "10",
day = "4",
language = "Undefined",
pages = "157--161",
booktitle = "Proceedings 6th International Conference Quality in Electronic Components Failure Prevention, Detection and Analysis, ESREF '93",

}

Lunenborg, MM, Wolbert, PBM, Meijer, PBL, Nguyen, TP & Verweij, JF 1993, PRESS - A Circuit Simulator with Built-In Reliability Model for Hot-Carrier Degradation. in Proceedings 6th International Conference Quality in Electronic Components Failure Prevention, Detection and Analysis, ESREF '93. Bordeaux, Arcachon, France, pp. 157-161.

PRESS - A Circuit Simulator with Built-In Reliability Model for Hot-Carrier Degradation. / Lunenborg, M.M.; Wolbert, P.B.M.; Meijer, P.B.L.; Nguyen, T.P.; Verweij, J.F.

Proceedings 6th International Conference Quality in Electronic Components Failure Prevention, Detection and Analysis, ESREF '93. Bordeaux, Arcachon, France, 1993. p. 157-161.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

TY - GEN

T1 - PRESS - A Circuit Simulator with Built-In Reliability Model for Hot-Carrier Degradation

AU - Lunenborg, M.M.

AU - Wolbert, P.B.M.

AU - Meijer, P.B.L.

AU - Nguyen, T.P.

AU - Verweij, J.F.

PY - 1993/10/4

Y1 - 1993/10/4

KW - METIS-113992

M3 - Conference contribution

SP - 157

EP - 161

BT - Proceedings 6th International Conference Quality in Electronic Components Failure Prevention, Detection and Analysis, ESREF '93

CY - Bordeaux, Arcachon, France

ER -

Lunenborg MM, Wolbert PBM, Meijer PBL, Nguyen TP, Verweij JF. PRESS - A Circuit Simulator with Built-In Reliability Model for Hot-Carrier Degradation. In Proceedings 6th International Conference Quality in Electronic Components Failure Prevention, Detection and Analysis, ESREF '93. Bordeaux, Arcachon, France. 1993. p. 157-161