PRESS - A Circuit Simulator with Built-In Reliability Model for Hot-Carrier Degradation

M.M. Lunenborg, P.B.M. Wolbert, P.B.L. Meijer, T.P. Nguyen, J.F. Verweij

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings 6th International Conference Quality in Electronic Components Failure Prevention, Detection and Analysis, ESREF '93
    Place of PublicationBordeaux, Arcachon, France
    Publication statusPublished - 4 Oct 1993


    • METIS-113992

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