PRESS - A Circuit Simulator with Built-In Reliability Model for Hot-Carrier Degradation

M.M. Lunenborg, P.B.M. Wolbert, P.B.L. Meijer, T.P. Nguyen, J.F. Verweij

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings 6th International Conference Quality in Electronic Components Failure Prevention, Detection and Analysis, ESREF '93
    Place of PublicationBordeaux, Arcachon, France
    Pages157-161
    Publication statusPublished - 4 Oct 1993

    Keywords

    • METIS-113992

    Cite this

    Lunenborg, M. M., Wolbert, P. B. M., Meijer, P. B. L., Nguyen, T. P., & Verweij, J. F. (1993). PRESS - A Circuit Simulator with Built-In Reliability Model for Hot-Carrier Degradation. In Proceedings 6th International Conference Quality in Electronic Components Failure Prevention, Detection and Analysis, ESREF '93 (pp. 157-161). Bordeaux, Arcachon, France.
    Lunenborg, M.M. ; Wolbert, P.B.M. ; Meijer, P.B.L. ; Nguyen, T.P. ; Verweij, J.F. / PRESS - A Circuit Simulator with Built-In Reliability Model for Hot-Carrier Degradation. Proceedings 6th International Conference Quality in Electronic Components Failure Prevention, Detection and Analysis, ESREF '93. Bordeaux, Arcachon, France, 1993. pp. 157-161
    @inproceedings{26657b8085d340ab8a1f4dfd6e308fda,
    title = "PRESS - A Circuit Simulator with Built-In Reliability Model for Hot-Carrier Degradation",
    keywords = "METIS-113992",
    author = "M.M. Lunenborg and P.B.M. Wolbert and P.B.L. Meijer and T.P. Nguyen and J.F. Verweij",
    year = "1993",
    month = "10",
    day = "4",
    language = "Undefined",
    pages = "157--161",
    booktitle = "Proceedings 6th International Conference Quality in Electronic Components Failure Prevention, Detection and Analysis, ESREF '93",

    }

    Lunenborg, MM, Wolbert, PBM, Meijer, PBL, Nguyen, TP & Verweij, JF 1993, PRESS - A Circuit Simulator with Built-In Reliability Model for Hot-Carrier Degradation. in Proceedings 6th International Conference Quality in Electronic Components Failure Prevention, Detection and Analysis, ESREF '93. Bordeaux, Arcachon, France, pp. 157-161.

    PRESS - A Circuit Simulator with Built-In Reliability Model for Hot-Carrier Degradation. / Lunenborg, M.M.; Wolbert, P.B.M.; Meijer, P.B.L.; Nguyen, T.P.; Verweij, J.F.

    Proceedings 6th International Conference Quality in Electronic Components Failure Prevention, Detection and Analysis, ESREF '93. Bordeaux, Arcachon, France, 1993. p. 157-161.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    TY - GEN

    T1 - PRESS - A Circuit Simulator with Built-In Reliability Model for Hot-Carrier Degradation

    AU - Lunenborg, M.M.

    AU - Wolbert, P.B.M.

    AU - Meijer, P.B.L.

    AU - Nguyen, T.P.

    AU - Verweij, J.F.

    PY - 1993/10/4

    Y1 - 1993/10/4

    KW - METIS-113992

    M3 - Conference contribution

    SP - 157

    EP - 161

    BT - Proceedings 6th International Conference Quality in Electronic Components Failure Prevention, Detection and Analysis, ESREF '93

    CY - Bordeaux, Arcachon, France

    ER -

    Lunenborg MM, Wolbert PBM, Meijer PBL, Nguyen TP, Verweij JF. PRESS - A Circuit Simulator with Built-In Reliability Model for Hot-Carrier Degradation. In Proceedings 6th International Conference Quality in Electronic Components Failure Prevention, Detection and Analysis, ESREF '93. Bordeaux, Arcachon, France. 1993. p. 157-161