Abstract
Soft errors in embedded systems' memories like single-event upsets and multiple-bit upsets lead to data and instruction corruption. Therefore, devices deployed in harsh environments, such as space, use fault-tolerant processors or redundancy methods to ensure critical application dependability. Another rising concern in secure, critical space applications is the possible introduction of hardware Trojans in an untrusted phase of the manufacturing process. Besides environmental side-effects, an adversary that has injected a malicious mechanism e.g., in the processor or memory can trigger unwanted behavior or leak sensitive information. Techniques to prevent or mitigate hardware Trojans are important to ensure hardware security. Leveraging the openness of the RISC-V ISA, this paper introduces a novel solution to improve the security and dependability of softcores with a low area and latency overhead. The instruction validator which is the first part of this solution can effectively detect hardware Trojans and multiple-bit upsets in the instruction memory by checking instruction/address pairs using a Bloom filter probabilistic data structure. The second part of the solution is the proposal of an error correction code instruction memory using Hamming single-error correction to detect and correct single-event upsets. It has also been proven that the Hamming decoder improves the detection performance of the instruction validator.
Original language | English |
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Title of host publication | Proceedings - 35th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022 |
Editors | Luca Cassano, Sreejit Chakravarty, Alberto Bosio |
Publisher | IEEE |
Number of pages | 6 |
ISBN (Electronic) | 978-1-6654-5938-9 |
DOIs | |
Publication status | Published - Dec 2022 |
Event | 35th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022 - Austin, United States Duration: 19 Oct 2022 → 21 Oct 2022 Conference number: 35 |
Publication series
Name | Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT |
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Volume | 2022-October |
ISSN (Print) | 2576-1501 |
ISSN (Electronic) | 2765-933X |
Conference
Conference | 35th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022 |
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Abbreviated title | DFT 2022 |
Country/Territory | United States |
City | Austin |
Period | 19/10/22 → 21/10/22 |
Keywords
- Bloom Filters
- Hardware Dependability
- Hardware Security
- Hardware Trojans
- RISC-V
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