Preventing Soft Errors and Hardware Trojans in RISC-V Cores

Edian B. Annink, Gerard Rauwerda, Edwin Hakkennes, Alessandra Menicucci, Stefano Di Mascio, Gianluca Furano, Marco Ottavi

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

4 Citations (Scopus)
169 Downloads (Pure)

Abstract

Soft errors in embedded systems' memories like single-event upsets and multiple-bit upsets lead to data and instruction corruption. Therefore, devices deployed in harsh environments, such as space, use fault-tolerant processors or redundancy methods to ensure critical application dependability. Another rising concern in secure, critical space applications is the possible introduction of hardware Trojans in an untrusted phase of the manufacturing process. Besides environmental side-effects, an adversary that has injected a malicious mechanism e.g., in the processor or memory can trigger unwanted behavior or leak sensitive information. Techniques to prevent or mitigate hardware Trojans are important to ensure hardware security. Leveraging the openness of the RISC-V ISA, this paper introduces a novel solution to improve the security and dependability of softcores with a low area and latency overhead. The instruction validator which is the first part of this solution can effectively detect hardware Trojans and multiple-bit upsets in the instruction memory by checking instruction/address pairs using a Bloom filter probabilistic data structure. The second part of the solution is the proposal of an error correction code instruction memory using Hamming single-error correction to detect and correct single-event upsets. It has also been proven that the Hamming decoder improves the detection performance of the instruction validator.

Original languageEnglish
Title of host publicationProceedings - 35th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022
EditorsLuca Cassano, Sreejit Chakravarty, Alberto Bosio
PublisherIEEE
Number of pages6
ISBN (Electronic)978-1-6654-5938-9
DOIs
Publication statusPublished - Dec 2022
Event35th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022 - Austin, United States
Duration: 19 Oct 202221 Oct 2022
Conference number: 35

Publication series

NameProceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT
Volume2022-October
ISSN (Print)2576-1501
ISSN (Electronic)2765-933X

Conference

Conference35th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022
Abbreviated titleDFT 2022
Country/TerritoryUnited States
CityAustin
Period19/10/2221/10/22

Keywords

  • Bloom Filters
  • Hardware Dependability
  • Hardware Security
  • Hardware Trojans
  • RISC-V
  • 2023 OA procedure

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