Probabilistic Verification for Reliability of a Two-by-Two Network-on-Chip System

Riley Roberts, Benjamin Lewis, Arnd Hartmanns, Prabal Basu, Sanghamitra Roy, Koushik Chakraborty, Zhen Zhang

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Citation (Scopus)
21 Downloads (Pure)


Modern network-on-chip (NoC) systems face reliability issues due to process and environmental variations. The power supply noise (PSN) in the power delivery network of a NoC plays a key role in determining reliability. PSN leads to voltage droop, which can cause timing errors in the NoC. This paper makes a novel contribution towards formally analyzing PSN in NoC systems. We present a probabilistic model checking approach to analyze key features of PSN at the behavioral level in a 2×2 mesh NoC with a uniform random traffic load. To tackle state explosion, we apply incremental abstraction techniques, including a novel probabilistic choice abstraction, based on observations of NoC behavior. The Modest Toolset is used for probabilistic modeling and verification. Results are obtained for several flit injection patterns to reveal their impacts on PSN. Our analysis finds an optimal flit pattern generation with zero probability of PSN events and suggests spreading flits rather than releasing them in consecutive cycles in order to minimize PSN.
Original languageEnglish
Title of host publicationFormal Methods for Industrial Critical Systems
Subtitle of host publication26th International Conference, FMICS 2021, Paris, France, August 24–26, 2021, Proceedings
EditorsAlberto Lluch-Lafuente, Anastasia Mavridou
Place of PublicationCham
Number of pages17
ISBN (Electronic)978-3-030-85248-1
ISBN (Print)978-3-030-85247-4
Publication statusPublished - 19 Aug 2021
Event26th International Conference on Formal Methods for Industrial Critical Systems, FMICS 2021 - Virtual Conference
Duration: 24 Aug 202126 Aug 2021
Conference number: 26

Publication series

NameLecture Notes in Computer Science
ISSN (Print)0302-9743
ISSN (Electronic)1611-3349


Conference26th International Conference on Formal Methods for Industrial Critical Systems, FMICS 2021
Abbreviated titleFMICS 2021
CityVirtual Conference


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