Probing field distributions on waveguide structures with an atomic force/photon scanning tunneling microscope

E.G. Borgonjen, M.H.P. Moers, A.G.T. Ruiter, N.F. van Hulst

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Abstract

A 'stand-alone' Photon Scanning Tunneling Microscope combined with an Atomic force Microscope, using a micro-fabricated silicon-nitride probe, is applied to the imaging of field distribution in integrated optical ridge waveguides. The electric field on the waveguide is locally probed by coupling to the evanescent wave. Application to direct observation of TM and TE modal field distributions, both in lateral and vertical direction, mode beating between low and higher order modes, and behavior of a Y-junction wavelength (de)multiplexer is demonstrated.
Original languageEnglish
Title of host publicationNear-Field Optics
Subtitle of host publicationSPIE's 1995 International Conference on Optical Science, Engineering, and Instrumentation, 9-14 July 1995
EditorsMichael A. Paesler, Patrick J. Moyer
PublisherSPIE
Pages125-131
Number of pages7
ISBN (Print)0-8194-1894-3
DOIs
Publication statusPublished - 20 Oct 1995
EventSPIE's International Conference on Optical Science, Engineering, and Instrumentation 1995: Near-Field Optics - San Diego, United States
Duration: 9 Jul 199514 Jul 1995

Publication series

NameProceedings of SPIE
PublisherSPIE
Volume2535

Conference

ConferenceSPIE's International Conference on Optical Science, Engineering, and Instrumentation 1995
CountryUnited States
CitySan Diego
Period9/07/9514/07/95

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