Original language | English |
---|---|
Number of pages | 343 |
Journal | Microelectronics reliability |
Volume | 36 |
Issue number | 11/12 |
Publication status | Published - 1996 |
Event | 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 1996 - University of Twente, Enschede, Netherlands Duration: 8 Oct 1996 → 11 Oct 1996 Conference number: 7 |
Keywords
- METIS-112411