Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis: 8-11 October 1996, Enschede, The Netherlands

Guido Groeseneken, Herman E. Maes, Anton J. Mouthaan, Jan F. Verweij

    Research output: Contribution to journalSpecial issueAcademicpeer-review

    Original languageEnglish
    Number of pages343
    JournalMicroelectronics reliability
    Volume36
    Issue number11/12
    Publication statusPublished - 1996
    Event7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 1996 - University of Twente, Enschede, Netherlands
    Duration: 8 Oct 199611 Oct 1996
    Conference number: 7

    Keywords

    • METIS-112411

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