Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis: 8-11 October 1996, Enschede, The Netherlands

Guido Groeseneken; Herman E. Maes; Anton J. Mouthaan; Jan F. Verweij

Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis: 8-11 October 1996, Enschede, The Netherlands

Guido Groeseneken, Herman E. Maes, Anton J. Mouthaan, Jan F. Verweij

Research output: Contribution to journal › Special issue › Academic › peer-review

Original language	English
Number of pages	343
Journal	Microelectronics reliability
Volume	36
Issue number	11/12
Publication status	Published - 1996
Event	7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 1996 - University of Twente, Enschede, Netherlands Duration: 8 Oct 1996 → 11 Oct 1996 Conference number: 7

Keywords

METIS-112411

Access to Document

https://www.sciencedirect.com/science/journal/00262714/36/11-12

Cite this

@article{2dde0c62977649e8adff0c70d2c735de,

title = "Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis: 8-11 October 1996, Enschede, The Netherlands",

keywords = "METIS-112411",

author = "Guido Groeseneken and Maes, \{Herman E.\} and Mouthaan, \{Anton J.\} and Verweij, \{Jan F.\}",

year = "1996",

language = "English",

volume = "36",

journal = "Microelectronics reliability",

issn = "0026-2714",

publisher = "Elsevier Ltd",

number = "11/12",

note = "7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 1996, ESREF ; Conference date: 08-10-1996 Through 11-10-1996",

}

TY - JOUR

T1 - Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis

T2 - 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 1996

AU - Groeseneken, Guido

AU - Maes, Herman E.

AU - Mouthaan, Anton J.

AU - Verweij, Jan F.

N1 - Conference code: 7

PY - 1996

Y1 - 1996

KW - METIS-112411

M3 - Special issue

SN - 0026-2714

VL - 36

JO - Microelectronics reliability

JF - Microelectronics reliability

IS - 11/12

Y2 - 8 October 1996 through 11 October 1996

ER -