Process Qualification Strategy for Advances Embedded Non Volatile Memory Technology: The Philips' 0.18um Embedded Flash Case

Guoqiao Tao; Andrea Scarpa; Kitty van Dijk; Fred G. Kuper

doi:10.1109/RELPHY.2003.1197827

Process Qualification Strategy for Advances Embedded Non Volatile Memory Technology: The Philips' 0.18um Embedded Flash Case

Guoqiao Tao
, Andrea Scarpa
, Kitty van Dijk
, Fred G. Kuper

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

4 Downloads (Pure)

Abstract

A qualification strategy for advanced embedded non-volatile memory technology has been revealed. This strategy consists of: a thorough understanding of the requirements, extensive use and frequent update of the FMEA (failure mode effect analysis), a qualification plan with excellent coverage of all the risk areas, implementing effective in-line and off-line measures and control, and check-off of all the tests with good results. With such a strategy in place, the Philips 0.18 /spl mu/m embedded flash technology has been successfully qualified for volume production.

Original language	English
Title of host publication	2003 IEEE International Reliability Physics Symposium proceedings
Subtitle of host publication	41st annual : Dallas, Texas, March 30-April 4, 2003
Place of Publication	Piscataway, NJ
Publisher	IEEE
Pages	604-605
Number of pages	2
ISBN (Print)	0-7803-7649-8
DOIs	https://doi.org/10.1109/RELPHY.2003.1197827
Publication status	Published - 30 Mar 2003
Event	41st Annual IEEE International Reliability Physics Symposium, IRPS 2003 - Dallas, United States Duration: 30 Mar 2003 → 4 Apr 2003

Conference

Conference	41st Annual IEEE International Reliability Physics Symposium, IRPS 2003
Abbreviated title	IRPS
Country/Territory	United States
City	Dallas
Period	30/03/03 → 4/04/03

Keywords

METIS-215880

Access to Document

10.1109/RELPHY.2003.1197827

Cite this

Tao, G., Scarpa, A., van Dijk, K., & Kuper, F. G. (2003). Process Qualification Strategy for Advances Embedded Non Volatile Memory Technology: The Philips' 0.18um Embedded Flash Case. In 2003 IEEE International Reliability Physics Symposium proceedings: 41st annual : Dallas, Texas, March 30-April 4, 2003 (pp. 604-605). IEEE. https://doi.org/10.1109/RELPHY.2003.1197827

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title = "Process Qualification Strategy for Advances Embedded Non Volatile Memory Technology: The Philips' 0.18um Embedded Flash Case",

abstract = "A qualification strategy for advanced embedded non-volatile memory technology has been revealed. This strategy consists of: a thorough understanding of the requirements, extensive use and frequent update of the FMEA (failure mode effect analysis), a qualification plan with excellent coverage of all the risk areas, implementing effective in-line and off-line measures and control, and check-off of all the tests with good results. With such a strategy in place, the Philips 0.18 /spl mu/m embedded flash technology has been successfully qualified for volume production.",

keywords = "METIS-215880",

author = "Guoqiao Tao and Andrea Scarpa and \{van Dijk\}, Kitty and Kuper, \{Fred G.\}",

year = "2003",

month = mar,

day = "30",

doi = "10.1109/RELPHY.2003.1197827",

language = "English",

isbn = "0-7803-7649-8",

pages = "604--605",

booktitle = "2003 IEEE International Reliability Physics Symposium proceedings",

publisher = "IEEE",

address = "United States",

note = "41st Annual IEEE International Reliability Physics Symposium, IRPS 2003, IRPS ; Conference date: 30-03-2003 Through 04-04-2003",

}

Tao, G, Scarpa, A, van Dijk, K & Kuper, FG 2003, Process Qualification Strategy for Advances Embedded Non Volatile Memory Technology: The Philips' 0.18um Embedded Flash Case. in 2003 IEEE International Reliability Physics Symposium proceedings: 41st annual : Dallas, Texas, March 30-April 4, 2003. IEEE, Piscataway, NJ, pp. 604-605, 41st Annual IEEE International Reliability Physics Symposium, IRPS 2003, Dallas, Texas, United States, 30/03/03. https://doi.org/10.1109/RELPHY.2003.1197827

Process Qualification Strategy for Advances Embedded Non Volatile Memory Technology: The Philips' 0.18um Embedded Flash Case. / Tao, Guoqiao; Scarpa, Andrea; van Dijk, Kitty et al.
2003 IEEE International Reliability Physics Symposium proceedings: 41st annual : Dallas, Texas, March 30-April 4, 2003. Piscataway, NJ: IEEE, 2003. p. 604-605.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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T2 - 41st Annual IEEE International Reliability Physics Symposium, IRPS 2003

AU - Tao, Guoqiao

AU - Scarpa, Andrea

AU - van Dijk, Kitty

AU - Kuper, Fred G.

PY - 2003/3/30

Y1 - 2003/3/30

N2 - A qualification strategy for advanced embedded non-volatile memory technology has been revealed. This strategy consists of: a thorough understanding of the requirements, extensive use and frequent update of the FMEA (failure mode effect analysis), a qualification plan with excellent coverage of all the risk areas, implementing effective in-line and off-line measures and control, and check-off of all the tests with good results. With such a strategy in place, the Philips 0.18 /spl mu/m embedded flash technology has been successfully qualified for volume production.

AB - A qualification strategy for advanced embedded non-volatile memory technology has been revealed. This strategy consists of: a thorough understanding of the requirements, extensive use and frequent update of the FMEA (failure mode effect analysis), a qualification plan with excellent coverage of all the risk areas, implementing effective in-line and off-line measures and control, and check-off of all the tests with good results. With such a strategy in place, the Philips 0.18 /spl mu/m embedded flash technology has been successfully qualified for volume production.

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DO - 10.1109/RELPHY.2003.1197827

M3 - Conference contribution

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BT - 2003 IEEE International Reliability Physics Symposium proceedings

PB - IEEE

CY - Piscataway, NJ

Y2 - 30 March 2003 through 4 April 2003

ER -

Process Qualification Strategy for Advances Embedded Non Volatile Memory Technology: The Philips' 0.18um Embedded Flash Case

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