Properties of broadband depth-graded multilayer mirrors for EUV optical systems

A.E. Yakshin, I.V. Kozhevnikov, E. Zoethout, E. Louis, F. Bijkerk

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Abstract

The optical properties of a-periodic, depth-graded multilayer mirrors operating at 13.5 nm wavelength are investigated using different compositions and designs to provide a constant reflectivity over an essentially wider angular range than periodic multilayers. A reflectivity of up to about 60% is achieved in these calculation in the [0, 18°] range of the angle of incidence for the structures without roughness. The effects of different physical and technological factors (interfacial roughness, natural interlayers, number of bi-layers, minimum layer thickness, inaccuracy of optical constants, and thickness errors) are discussed. The results from an experiment on the fabrication of a depth-graded Mo/Si multilayer mirror with a wide angular bandpass in the [0, 16°] range are presented and analyzed.
Original languageEnglish
Pages (from-to)6957-6971
Number of pages15
JournalOptics express
Volume18
Issue number7
DOIs
Publication statusPublished - 2010

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