Properties of rf sputtered Co/Pt and Co/Pd multilayers

S. de Haan, J.C. Lodder, P. de Haan, T. Katayama

    Research output: Contribution to journalConference articleAcademicpeer-review

    9 Downloads (Pure)

    Abstract

    Series of Co/Pt and Co/pd multilayers have been prepared by RF sputtering (Leybold Z-400) using Ar and Kr as sputtering gas. In this case we used one target position on which two small targets were fixed. The background pressure was typically 1*10-7 mbar. The substrates were positioned below the targets on a rotating table. The thickness was determined by measuring exposure time combined with Dektak and low angle x-ray measurements. The number of bi-layers is 25. The hysteresis loops were measured by VSM and MOKE tracer.
    The effective anisotropy has been measured by Torque measurements and further characterisation has been made by low and high angle x-ray diffraction. All films have been prepared on Si (100) substrates and a comparison is made between MLs with and without a 20 nm seedlayer.
    Some basic properties of the Co/Pt and Co/Pd multilayers are given in table 1.
    Original languageEnglish
    Pages (from-to)89-90
    Number of pages2
    JournalJournal of the Magnetics Society of Japan
    Volume17
    Issue numberSuppl. 1
    DOIs
    Publication statusPublished - 1993
    Event2nd Magneto-Optical Recording International Symposium, MORIS 1992 - Hotel Park, Tuscon, United States
    Duration: 7 Dec 19929 Dec 1992
    Conference number: 2

    Fingerprint Dive into the research topics of 'Properties of rf sputtered Co/Pt and Co/Pd multilayers'. Together they form a unique fingerprint.

    Cite this