Properties of small leakage currents resulting from ESD stress and their latency aspects

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings of the 6th European Symposium Reliability of Electron Devices, Failure Physics and Analysis, ESREF '95
Place of Publication	Bordeaux, Arcachon, France
Pages	217-222
Publication status	Published - 3 Oct 1995

Keywords

@inproceedings{08c6a51ea97e47ee9b7e0e15472e94ac,

title = "Properties of small leakage currents resulting from ESD stress and their latency aspects",

keywords = "METIS-113975",

author = "J.R.M. Luchies and J.C. Reiner",

year = "1995",

month = oct,

day = "3",

language = "Undefined",

pages = "217--222",

booktitle = "Proceedings of the 6th European Symposium Reliability of Electron Devices, Failure Physics and Analysis, ESREF '95",

}

Properties of small leakage currents resulting from ESD stress and their latency aspects. / Luchies, J.R.M.; Reiner, J.C.
Proceedings of the 6th European Symposium Reliability of Electron Devices, Failure Physics and Analysis, ESREF '95. Bordeaux, Arcachon, France, 1995. p. 217-222.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Properties of small leakage currents resulting from ESD stress and their latency aspects

AU - Luchies, J.R.M.

AU - Reiner, J.C.

PY - 1995/10/3

Y1 - 1995/10/3

KW - METIS-113975

M3 - Conference contribution

SP - 217

EP - 222

BT - Proceedings of the 6th European Symposium Reliability of Electron Devices, Failure Physics and Analysis, ESREF '95

CY - Bordeaux, Arcachon, France

ER -