Abstract
In this paper a review is presented of light emission from forward-biased silicon diodes. After a treatment of the carrier recombination physics governing in this indirect-bandgap material, the article describes important works in this field. Then, routes are proposed for further improvement of the internal quantum efficiency for light emission. A good choice of carrier injection level will limit the impact of both Shockley-Read-Hall recombination and Auger recombination. However, the structural design of the diode has a strong influence on the overall quantum efficiency, as both surface recombination must be dealt with, and contact recombination avoided. New attributes of CMOS such as embedded SiGe offer additional opportunities for silicon LED architectures and their application.
Original language | English |
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Title of host publication | Fourth Conference on Sensors, MEMS, and Electro-Optic Systems |
Subtitle of host publication | 18–20 September 2016, Skukuza, Kruger National Park, South Africa |
Editors | Monuko du Plessis |
Publisher | SPIE |
Pages | 2-7 |
Number of pages | 6 |
ISBN (Electronic) | 9781510605145 |
ISBN (Print) | 9781510605138 |
DOIs | |
Publication status | Published - 3 Feb 2017 |
Event | 4th Conference on Sensors, MEMS, and Electro-Optic Systems, SMEOS 2016 - Nombolo Mdhluli Conference Centre, Skukuza, Kruger National Park, South Africa Duration: 12 Sep 2016 → 15 Sep 2016 Conference number: 4 |
Publication series
Name | Proceedings of SPIE |
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Publisher | SPIE |
Volume | 10036 |
ISSN (Print) | 0277-786X |
ISSN (Electronic) | 1996-756X |
Conference
Conference | 4th Conference on Sensors, MEMS, and Electro-Optic Systems, SMEOS 2016 |
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Abbreviated title | SMEOS |
Country/Territory | South Africa |
City | Skukuza, Kruger National Park |
Period | 12/09/16 → 15/09/16 |
Keywords
- recombination
- diodes
- EWI-27757
- light emitters
- IR-103621
- LEDs
- Silicon
- CMOS