Pulse-length determination techniques in the rectangular single event transient fault model

A. Rohani; Hans G. Kerkhoff; enrico costenaro; Dan Alexandrescu

doi:10.1109/SAMOS.2013.6621125

Pulse-length determination techniques in the rectangular single event transient fault model

A. Rohani, Hans G. Kerkhoff, enrico costenaro, Dan Alexandrescu

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

4 Citations (Scopus)

11 Downloads (Pure)

Abstract

One of the well-known models to represent Single Event Transient phenomenon at the logic-level is the rectangular pulse model. However, the pulse-length in this model has a vital contribution to the accuracy and validity of the rectangular pulse model. The work presented in this paper develops two approaches for determination of the pulse-length of the rectangular pulse model used in Single Event Transient (SET) faults. The first determination approach has been extracted from radiation testing along with transistor-level SET analysis tools. The second determination approach has been elicited from asymptotic analytical behaviour of SETs in 45-nm CMOS process. The results show that applying these two pulse-length determination approaches to the rectangular pulse model will cause the fault injection results converge much faster (up to sixteen times), compared to other conventional approaches.

Original language	Undefined
Title of host publication	International Conference on Embedded Computer Systems: architectures, modeling, and simulation, SAMOS XIII
Place of Publication	USA
Publisher	IEEE
Pages	213-218
Number of pages	6
ISBN (Print)	978-1-4799-0103-6
DOIs	https://doi.org/10.1109/SAMOS.2013.6621125
Publication status	Published - Jul 2013
Event	2013 International Conference on Embedded Computer Systems: Architectures, Modeling, and Simulation, IC-SAMOS XIII - Institute of East Aegean, Samos, Greece Duration: 15 Jul 2013 → 18 Jul 2013 Conference number: 13

Publication series

Name
Publisher	IEEE Computer Society

Conference

Conference	2013 International Conference on Embedded Computer Systems: Architectures, Modeling, and Simulation, IC-SAMOS XIII
Abbreviated title	IC-SAMOS
Country/Territory	Greece
City	Samos
Period	15/07/13 → 18/07/13

Keywords

EWI-23748
METIS-300228
IR-88286

Access to Document

10.1109/SAMOS.2013.6621125

http://eprints.eemcs.utwente.nl/secure2/23748/01/SAMOS_2013_rohani.pdf

Cite this

@inproceedings{fdaa31563e2f46b2bb166eeaca634b39,

title = "Pulse-length determination techniques in the rectangular single event transient fault model",

abstract = "One of the well-known models to represent Single Event Transient phenomenon at the logic-level is the rectangular pulse model. However, the pulse-length in this model has a vital contribution to the accuracy and validity of the rectangular pulse model. The work presented in this paper develops two approaches for determination of the pulse-length of the rectangular pulse model used in Single Event Transient (SET) faults. The first determination approach has been extracted from radiation testing along with transistor-level SET analysis tools. The second determination approach has been elicited from asymptotic analytical behaviour of SETs in 45-nm CMOS process. The results show that applying these two pulse-length determination approaches to the rectangular pulse model will cause the fault injection results converge much faster (up to sixteen times), compared to other conventional approaches.",

keywords = "EWI-23748, METIS-300228, IR-88286",

author = "A. Rohani and Kerkhoff, {Hans G.} and enrico costenaro and Dan Alexandrescu",

note = "eemcs-eprint-23748 ; 2013 International Conference on Embedded Computer Systems: Architectures, Modeling, and Simulation, IC-SAMOS XIII ; Conference date: 15-07-2013 Through 18-07-2013",

year = "2013",

month = jul,

doi = "10.1109/SAMOS.2013.6621125",

language = "Undefined",

isbn = "978-1-4799-0103-6",

publisher = "IEEE",

pages = "213--218",

booktitle = "International Conference on Embedded Computer Systems: architectures, modeling, and simulation, SAMOS XIII",

address = "United States",

}

Rohani, A, Kerkhoff, HG, costenaro, E & Alexandrescu, D 2013, Pulse-length determination techniques in the rectangular single event transient fault model. in International Conference on Embedded Computer Systems: architectures, modeling, and simulation, SAMOS XIII. IEEE, USA, pp. 213-218, 2013 International Conference on Embedded Computer Systems: Architectures, Modeling, and Simulation, IC-SAMOS XIII, Samos, Greece, 15/07/13. https://doi.org/10.1109/SAMOS.2013.6621125

Pulse-length determination techniques in the rectangular single event transient fault model. / Rohani, A.; Kerkhoff, Hans G.; costenaro, enrico et al.
International Conference on Embedded Computer Systems: architectures, modeling, and simulation, SAMOS XIII. USA: IEEE, 2013. p. 213-218.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Pulse-length determination techniques in the rectangular single event transient fault model

AU - Rohani, A.

AU - Kerkhoff, Hans G.

AU - costenaro, enrico

AU - Alexandrescu, Dan

N1 - Conference code: 13

PY - 2013/7

Y1 - 2013/7

N2 - One of the well-known models to represent Single Event Transient phenomenon at the logic-level is the rectangular pulse model. However, the pulse-length in this model has a vital contribution to the accuracy and validity of the rectangular pulse model. The work presented in this paper develops two approaches for determination of the pulse-length of the rectangular pulse model used in Single Event Transient (SET) faults. The first determination approach has been extracted from radiation testing along with transistor-level SET analysis tools. The second determination approach has been elicited from asymptotic analytical behaviour of SETs in 45-nm CMOS process. The results show that applying these two pulse-length determination approaches to the rectangular pulse model will cause the fault injection results converge much faster (up to sixteen times), compared to other conventional approaches.

AB - One of the well-known models to represent Single Event Transient phenomenon at the logic-level is the rectangular pulse model. However, the pulse-length in this model has a vital contribution to the accuracy and validity of the rectangular pulse model. The work presented in this paper develops two approaches for determination of the pulse-length of the rectangular pulse model used in Single Event Transient (SET) faults. The first determination approach has been extracted from radiation testing along with transistor-level SET analysis tools. The second determination approach has been elicited from asymptotic analytical behaviour of SETs in 45-nm CMOS process. The results show that applying these two pulse-length determination approaches to the rectangular pulse model will cause the fault injection results converge much faster (up to sixteen times), compared to other conventional approaches.

KW - EWI-23748

KW - METIS-300228

KW - IR-88286

U2 - 10.1109/SAMOS.2013.6621125

DO - 10.1109/SAMOS.2013.6621125

M3 - Conference contribution

SN - 978-1-4799-0103-6

SP - 213

EP - 218

BT - International Conference on Embedded Computer Systems: architectures, modeling, and simulation, SAMOS XIII

PB - IEEE

CY - USA

T2 - 2013 International Conference on Embedded Computer Systems: Architectures, Modeling, and Simulation, IC-SAMOS XIII

Y2 - 15 July 2013 through 18 July 2013

ER -