TY - JOUR
T1 - QCA circuits for robust coplanar crossing
AU - Bhanja, Sanjukta
AU - Ottavi, Marco
AU - Lombardi, Fabrizio
AU - Pontarelli, Salvatore
N1 - Funding Information:
Dr. Lombardi has received many professional awards: the Visiting Fellowship at the British Columbia Advanced System Institute, University of Victoria, Canada (1988), twice the Texas Experimental Engineering Station Research Fellowship (1991– 1992, 1997–1998) the Halliburton Professorship (1995), the Outstanding Engineering Research Award at Northeastern University (2004) and an International Research Award from the Ministry of Science and Education of Japan (1993–1999). Dr.
Funding Information:
Lombardi was the recipient of the 1985/86 Research Initiation Award from the IEEE/Engineering Foundation and a Silver Quill Award from Motorola-Austin (1996). Since 2000, Dr. Lombardi is an Associate Editor of the IEEE Design and Test Magazine. He also serves as the Chair of the Committee on BNanotechnology Devices and Systems’’ of the Test Technology Technical Council of the IEEE (2003 - ). In the past, Dr. Lombardi was an Associate Editor (1996–2000) and the Associate Editor-in Chief (2000–2006) of IEEE Transactions on Computers and twice a Distinguished Visitor of the IEEE-CS (1990–1993 and 2001–2004). Since January 1, 2007 he is the Editor-In-Chief of the IEEE Transactions on Computers. Dr. Lombardi has been involved in organizing many international symposia, conferences and workshops sponsored by professional organizations as well as guest editor of Special Issues in archival journals and magazines such as IEEE Transactions on Computers, IEEE Transactions on Instrumentation and Measurement, the IEEE Micro Magazine and the IEEE Design & Test Magazine. He is the Founding General Chair of the IEEE Symposium on Network Computing and Applications. His research interests are testing and design of digital systems, bio and nano computing, emerging technologies, defect tolerance and CAD VLSI. He has extensively published in these areas and coauthored/edited seven books.
PY - 2007/6
Y1 - 2007/6
N2 - In this paper, different circuits of Quantum-dot Cellular Automata (QCA) are proposed for the so-called coplanar crossing. Coplanar crossing is one of the most interesting features of QCA because it allows for mono-layered interconnected circuits, whereas CMOS technology needs different levels of metalization. However, the characteristics of the coplanar crossing make it prone to malfunction due to thermal noise or defects. The proposed circuits exploit the majority voting properties of QCA to allow a robust crossing of wires on the Cartesian plane. This is accomplished using enlarged lines and voting. A Bayesian Network (BN) based simulator is utilized for evaluation; results are provided to assess robustness in the presence of cell defects and thermal effects. The BN simulator provides fast and reliable computation of the signal polarization versus normalized temperature. Simulation of the wire crossing circuits at different operating temperatures is provided with respect to defects and a quantitative metric for performance under temperature variations is proposed and assessed.
AB - In this paper, different circuits of Quantum-dot Cellular Automata (QCA) are proposed for the so-called coplanar crossing. Coplanar crossing is one of the most interesting features of QCA because it allows for mono-layered interconnected circuits, whereas CMOS technology needs different levels of metalization. However, the characteristics of the coplanar crossing make it prone to malfunction due to thermal noise or defects. The proposed circuits exploit the majority voting properties of QCA to allow a robust crossing of wires on the Cartesian plane. This is accomplished using enlarged lines and voting. A Bayesian Network (BN) based simulator is utilized for evaluation; results are provided to assess robustness in the presence of cell defects and thermal effects. The BN simulator provides fast and reliable computation of the signal polarization versus normalized temperature. Simulation of the wire crossing circuits at different operating temperatures is provided with respect to defects and a quantitative metric for performance under temperature variations is proposed and assessed.
KW - Bayesian network
KW - Coplanar crossing
KW - Defect characterization
KW - QCA
KW - Temperature characterization
KW - TMR
UR - http://www.scopus.com/inward/record.url?scp=34249895531&partnerID=8YFLogxK
U2 - 10.1007/s10836-006-0551-y
DO - 10.1007/s10836-006-0551-y
M3 - Article
SN - 0923-8174
VL - 23
SP - 193
EP - 210
JO - Journal of electronic testing
JF - Journal of electronic testing
IS - 2-3
ER -