Qualification of Hotcarrier Induced Damage in DMOS-Transistors

M.A.R.C. de Wolf

    Research output: Book/Report › Report › Professional

    Original languageUndefined
    Place of PublicationEnschede
    PublisherSemiconductor Components (SC)
    Number of pages74
    Publication statusPublished - 1998

    Keywords

    • METIS-115968

    Cite this