Quantitative analysis of X-ray photo emission spectra, acquired on c-axis oriented high-Tc superconducting YBa2Cu3O7-δ thin films

W.A.M. Aarnink, J. Gao, H. Rogalla, A. van Silfhout

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Abstract

Angle-resolved X-ray photoemission spectroscopy (ARXPS) was performed on c-axis oriented high-Tc superconducting YBa2Cu3O7−δ thin films. The layered structure of the YBa2Cu3O7−δ films was used to develop a model for the quantitative analysis of the ARXPS experiments. Our XPS results may be compared to spectra taken on YBa2Cu3O7−δ single-crystal surfaces. On the spectra features are supposed that are assigned to a thin non-superconducting surface layer. For the first time, relative ARXPS measurements show that the interface between the superconducting YBa2Cu3O7−δ film and the surface layer is formed by the atomic Y layer. The surface layer consists mainly of BaCO3 and C, A small volume fraction (≈20%) contains Ba- and Cu-oxides, probably in the form of BaCuO2. From absolute ARXPS measurements, the thickness of the surface layer was calculated to be 0.93 ± 0.06 nm. It is shown that the surface roughness of our films is on the order of 0.6 nm. A good agreement between theory and experiment has been found in this report.
Original languageEnglish
Pages (from-to)117-133
Number of pages17
JournalApplied surface science
Volume55
Issue number2-3
DOIs
Publication statusPublished - 1992

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